A compact electron beam ion source with integrated Wien filter providing mass and charge state separated beams of highly charged ions

被引:35
|
作者
Schmidt, M. [1 ]
Peng, H. [2 ]
Zschornack, G. [3 ]
Sykora, S. [4 ]
机构
[1] DREEBIT GmbH, D-01109 Dresden, Germany
[2] Lanzhou Univ, Sch Nucl Sci & Technol, Lanzhou 730000, Peoples R China
[3] Tech Univ Dresden, Inst Angew Phys, D-01062 Dresden, Germany
[4] Tech Univ Dresden, Inst Theoret Phys, D-01062 Dresden, Germany
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2009年 / 80卷 / 06期
基金
中国国家自然科学基金;
关键词
electron beams; ion sources; permanent magnets; xenon; TRAP;
D O I
10.1063/1.3125628
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A Wien filter was designed for and tested with a room temperature electron beam ion source (EBIS). Xenon charge state spectra up to the charge state Xe(46+) were resolved as well as the isotopes of krypton using apertures of different sizes. The complete setup consisting of an EBIS and a Wien filter has a length of less than 1 m substituting a complete classical beamline setup. The Wien filter is equipped with removable permanent magnets. Hence total beam current measurements are possible via simple removal of the permanent magnets. In dependence on the needs of resolution a weak (0.2 T) or a strong (0.5 T) magnets setup can be used. In this paper the principle of operation and the design of the Wien filter meeting the requirements of an EBIS are briefly discussed. The first ion beam extraction and separation experiments with a Dresden EBIS are presented.
引用
收藏
页数:6
相关论文
共 50 条
  • [1] Production of microbunched beams of very highly charged ions with an electron beam ion source
    Kansas State Univ, Manhattan, United States
    Review of Scientific Instruments, 1998, 69 (2 pt 2): : 649 - 651
  • [2] Production of microbunched beams of very highly charged ions with an electron beam ion source
    Stockli, MP
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (02): : 649 - 651
  • [3] Precision mass measurements using highly charged ions from an electron beam ion source
    Bergström, I
    Carlberg, C
    Douysset, G
    Fritioff, T
    Schuch, R
    ELECTRON BEAM ION SOURCES AND TRAPS AND THEIR APPLICATIONS, 2001, 572 : 238 - 257
  • [4] Development of electron beam ion source for nanoprocess using highly charged ions
    Sakurai, M
    Nakajima, F
    Fukumoto, T
    Nakamura, N
    Ohtani, S
    Mashiko, S
    Sakaue, H
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2005, 235 : 519 - 523
  • [5] Compact electron beam ion trap for spectroscopy of moderate charge state ions
    Nakamura, Nobuyuki
    Kikuchi, Hiroyuki
    Sakaue, Hiroyuki A.
    Watanabe, Tetsuya
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2008, 79 (06):
  • [6] Precision mass measurements using a penning trap and highly charged ions produced in an electron beam ion source
    Borgenstrand, H
    Carlberg, C
    Rouleau, G
    Schuch, R
    Soderberg, F
    Beebe, E
    Bergstrom, I
    Liljeby, L
    Paal, A
    Pikin, A
    Bollen, G
    Hartmann, H
    Jertz, R
    Kluge, HJ
    Schwarz, T
    Senne, P
    Mann, R
    PHYSICA SCRIPTA, 1997, T71 : 88 - 95
  • [7] Visible transitions of highly charged tungsten ions observed with a compact electron beam ion trap
    Minoshima, Maki
    Sakoda, Junpei
    Komatsu, Akihiro
    Sakaue, Hiroyuki A.
    Ding, Xiao-Bin
    Kato, Daiji
    Murakami, Izumi
    Dong, Chen-Zhong
    Koike, Fumihiro
    Watanabe, Hirofumi
    Nakamura, Nobuyuki
    PHYSICA SCRIPTA, 2013, T156
  • [8] Visible spectra of highly charged holmium ions observed with a compact electron beam ion trap
    Nakajima, Takayuki
    Okada, Kunihiro
    Wada, Michiharu
    Dzuba, Vladimir A.
    Safronova, Marianna S.
    Safronova, Ulyana I.
    Ohmae, Noriaki
    Katori, Hidetoshi
    Nakamura, Nobuyuki
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2017, 408 : 118 - 121
  • [9] The production of high-duty-cycle, high-yield beams of highly charged ions with an electron beam ion source
    Stockli, MP
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1996, 67 (03): : 892 - 894
  • [10] Resonant electron impact excitation of highly charged Fe ions studied with a compact electron beam ion trap
    Monobe, Masashi
    Sakaue, Hiroyuki A.
    Kato, Daiji
    Murakami, Izumi
    Hara, Hirohisa
    Watanabe, Tetsuya
    Nakamura, Nobuyuki
    X-RAY SPECTROMETRY, 2020, 49 (04) : 511 - 514