Ultrafast Electron Microscopy

被引:1
|
作者
Hawkes, Peter
机构
关键词
DIFFRACTION METHOD; CRYSTALLOGRAPHY; SCATTERING; KINETICS; BEAMS;
D O I
10.1016/B978-0-12-800145-5.00005-8
中图分类号
TH742 [显微镜];
学科分类号
摘要
引用
收藏
页码:231 / 262
页数:32
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