Neutron RTOF diffractometer FSD for residual stress investigation

被引：0
|
作者：
Balagurov, A. M. [1 ]
Bokuchava, G. D. [1 ]
Kumin, E. S. [1 ]
Tamonov, A. V. [1 ]
Zhuk, V. V. [1 ]
机构：
[1] Joint Inst Nucl Res Dubna, Frank Lab Neutron Phys, Dubna, Russia
来源：
ZEITSCHRIFT FUR KRISTALLOGRAPHIE | 2006年
关键词：
residual stress; RTOF method; neutron diffraction; pulsed reactor; Fourier method;
D O I：
暂无
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
In this paper we present the construction a new neutron Fourier diffractometer FSD and the details of the diffractometer's design. FSD is a specialized neutron diffractometer which is dedicated exclusively for residual stress studies the IBR-2 pulsed reactor in FLNP JINR. The principle of a Fourier stress diffractometer is based on an application of the reverse time-of-flight (RTOF) method - a kind of correlation technique - at long pulsed neutron sources. The FSD design satisfies the requirements of high luminosity, high resolution, a specific sample environment, a wide range of d(hkl), and fixed scattering angle 2 theta = +/- 90 degrees.
引用
收藏
页码：217 / 222
页数：6
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