Temperature Controlled Humidity Chamber for X-ray Diffraction Analysis

被引：1
|
作者：
Beckers, D. [1 ]
Doppler, P. [2 ]
Koppelhuber, B. [3 ]
Reiss, G. J. [4 ]
机构：
[1] Philips Analyt, Eindhoven, Netherlands
[2] Anton Paar GmbH, Graz, Austria
[3] Graz Univ Technol, Graz, Austria
[4] Heinrich Heine Univ Dusseldorf, Dusseldorf, Germany
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2000年 / 56卷
关键词：
temperature; humidity; instrumentation;
D O I：
10.1107/S0108767300024806
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
s7.m0.p5
引用
收藏
页码：S220 / S220
页数：1
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