Temperature resolved X-ray diffraction as a tool of thermal analysis

被引：0
|
作者：
W. Engel
N. Eisenreich
M. Herrmann
V. Kolarik
机构：
[1] Fraunhoferinstitut für Chemische Technologie,
来源：
Journal of thermal analysis | 1997年 / 49卷
关键词：
crystallographic evaluation; evaluation with difference procedure; kinetics; Rietveld refinement; X-ray diffraction; temperature resolved;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Time and temperature resolved X-ray diffraction was used for thermal analysis. Series of diffraction patterns were measured, while the samples are heated/cooled stepwise or isothermally with freely selectable temperature programs.
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页码：1025 / 1037
页数：12
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