Ultrahigh-yield growth of GaN via halogen-free vapor-phase epitaxy

被引:11
|
作者
Nakamura, Daisuke [1 ]
Kimura, Taishi [1 ]
机构
[1] Toyota Cent Res & Dev Labs Inc, Nagakute, Aichi 4801192, Japan
关键词
SILICON-CARBIDE; SINGLE-CRYSTALS; HYDRIDE; LAYERS; BULK;
D O I
10.7567/APEX.11.065502
中图分类号
O59 [应用物理学];
学科分类号
摘要
The material yield of Ga during GaN growth via halogen-free vapor-phase epitaxy (HF-VPE) was systematically investigated and found to be much higher than that obtained using conventional hydride VPE. This is attributed to the much lower process pressure and shorter seed-to-source distance, owing to the inherent chemical reactions and corresponding reactor design used for HF-VPE growth. Ultrahigh-yield GaN growth was demonstrated on a 4-in -diameter sapphire seed substrate. (C) 2018 The Japan Society of Applied Physics.
引用
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页数:4
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