Atomic Perspectives Rapid Multielement Nanoparticle Analysis Using Single-Particle ICP-MS/MS

被引：0
|
作者：
Jones, Craig [1 ]
Soffey, Emmett [2 ,3 ]
Kelinske, Mark [4 ,5 ]
机构：
[1] Agilent, Santa Clara, CA USA
[2] Agilent, Seattle, WA 98125 USA
[3] Brookhaven Natl Labs, Acid Rain Adirondack Mt Northern New York, Upton, NY 11973 USA
[4] Agilent, Elm Mott, TX USA
[5] Southern Res Inst, Birmingham, AL USA
来源：
SPECTROSCOPY | 2019年 / 34卷 / 05期
关键词：
D O I：
暂无
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
There are well recognized difficulties in measuring nanoparticles (NPs) accurately by conventional single-quadrupole inductively coupled plasma mass spectrometry (ICP-MS), because many natural and engineered NPs are based on elements that are challenging to measure at trace level by ICP-MS, such as iron, titanium, and silicon. This month's "Atomic Perspectives" column discusses how complex isobaric and polyatomic spectral interferences can be mitigated using triple-quadrupole ICP-MS (ICP-MS/MS) utilizing a collision-reaction cell (CRC), allowing for the multielement characterization and detection of smaller nanoparticle sizes.
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页码：10 / 20
页数：11
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