Combinatorial fabrication and study of luminescent nanocrystalline Si particles embedded in a SiO2 matrix

被引:0
|
作者
Fonseca, L. F. [1 ]
Resto, O. [1 ]
Weisz, S. Z. [1 ]
Shinar, J. [2 ]
机构
[1] Univ Puerto Rico, Dept Phys, Rio Piedras, PR 00931 USA
[2] US DOE, Dept Phys & Astron, Ames Lab, Ames, IA 50011 USA
关键词
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The combinatorial fabrication of nanocrystalline Si particles embedded in a SiO2 matrix (nc-Si:SiO2) by RF co-sputtering of Si and SiO2 targets is described. The peak of the photoluminescence (PL) spectra of the films varies systematically from 760 to 600 nm, consistent with the presumed systematic variation in the size distribution of the embedded Si particles. The correlation between the optical properties of the samples and the formation parameters is also analyzed.
引用
收藏
页码:205 / +
页数:2
相关论文
共 50 条
  • [31] Temperature dependent optical properties of Si nanocrystals embedded in SiO2 matrix
    Lin, Wei
    Zheng, Yu-Xiang
    Zhang, Rong-Jun
    Cai, Qing-Yuan
    Zhang, Dong-Xu
    Yu, Xiang
    Wu, Kang-Ning
    Chen, Liang-Yao
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2014, 114 (02): : 423 - 427
  • [32] Absorption of Si, Ge, and SiGe alloy nanocrystals embedded in SiO2 matrix
    Avdeev, I. D.
    Belolipetsky, A. V.
    Ha, N. N.
    Nestoklon, M. O.
    Yassievich, I. N.
    JOURNAL OF APPLIED PHYSICS, 2020, 127 (11)
  • [33] Temperature dependent optical properties of Si nanocrystals embedded in SiO2 matrix
    Wei Lin
    Yu-Xiang Zheng
    Rong-Jun Zhang
    Qing-Yuan Cai
    Dong-Xu Zhang
    Xiang Yu
    Kang-Ning Wu
    Liang-Yao Chen
    Applied Physics A, 2014, 114 : 423 - 427
  • [34] Optical properties of nanocrystalline silicon embedded in SiO2
    Zhixun Ma
    Xianbo Liao
    Guanglin Kong
    Junhao Chu
    Science in China Series A: Mathematics, 1999, 42 : 995 - 1002
  • [35] Synthesis and characterization of nc-Ge embedded in SiO2/Si matrix
    Rao, N. Srinivasa
    Dhamodaran, S.
    Pathak, A. P.
    Kabiraj, D.
    Khan, S. A.
    Panigrahi, B. K.
    Nair, K. G. M.
    Sundaravel, B.
    Pivin, J. C.
    Avasthi, D. K.
    RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2009, 164 (7-8): : 452 - 459
  • [36] Optical properties and their depth profiling of Si nanocrystals embedded in SiO2 matrix
    Chen, TP
    Liu, Y
    Tse, MS
    Gui, D
    BIOMEMS AND NANOTECHNOLOGY, 2003, 5275 : 378 - 382
  • [37] Investigation of Auger recombination in Ge and Si nanocrystals embedded in SiO2 matrix
    Mathdouani, M.
    Bourguiga, R.
    Jaziri, S.
    Gardelis, S.
    Nassiopoulou, A. G.
    PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2009, 42 (01): : 57 - 62
  • [38] Raman scattering of nanocrystalline silicon embedded in SiO2
    Ma, ZX
    Liao, XB
    Kong, GL
    Chu, JH
    SCIENCE IN CHINA SERIES A-MATHEMATICS PHYSICS ASTRONOMY, 2000, 43 (04): : 414 - 420
  • [39] Optical properties of nanocrystalline silicon embedded in SiO2
    马智训
    廖显伯
    孔光临
    褚君浩
    Science China Mathematics, 1999, (09) : 995 - 1002
  • [40] Optical properties of nanocrystalline silicon embedded in SiO2
    Ma, ZX
    Liao, XB
    Kong, GL
    Chu, JH
    SCIENCE IN CHINA SERIES A-MATHEMATICS PHYSICS ASTRONOMY, 1999, 42 (09): : 995 - 1002