Reliability Research for PV System Using BDD-Based Fault Tree Analysis

被引：0

作者：

Hu, Rong ^{[1
]}

Mi, Jinhua ^{[1
]}

Hu, Tianyou ^{[1
]}

Fu, Minling ^{[1
]}

Yang, Pan ^{[1
]}

机构：

[1] Univ Elect Sci & Technol China, Sch Mech Elect & Ind Engn, Chengdu 611731, Peoples R China

来源：

PROCEEDINGS OF 2013 INTERNATIONAL CONFERENCE ON QUALITY, RELIABILITY, RISK, MAINTENANCE, AND SAFETY ENGINEERING (QR2MSE), VOLS I-IV | 2013年

关键词：

photovoltaic; fault tree; binary decision diagram; reliability;

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

This paper mainly takes the photovoltaic system as the study object, analyze the performance and reliability of this system. Firstly, fault tree analysis method is introduced which aims at acquiring the top event probability of system failure. Secondly, the method of binary decision diagram is used to analyze the reliability of this system qualitatively and quantitatively. By sorting the basic events, the fault tree of photovoltaic system is established. The probability of failure for top event is calculated quantitatively based on qualitative analysis results, which can provide theoretical basis for the weak link of the system.

引用

页码：359 / 363

页数：5

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