The origin of switching noise in GaAs/AlGaAs lateral gated devices

被引:9
|
作者
Long, A. R. [1 ]
Pioro-Ladriere, M.
Davies, J. H.
Sachrajda, A. S.
Gaudreau, Louis
Zawadzki, P.
Lapointe, J.
Gupta, J.
Wasilewski, Z.
Studenikin, S. A.
机构
[1] Univ Glasgow, Dept Elect & Elect Engn, Nanoelectr Res Ctr, Glasgow G12 8QQ, Lanark, Scotland
[2] Natl Res Council Canada, Inst Microstruct Sci, Ottawa, ON K1A 0R6, Canada
[3] Univ Sherbrooke, Dept Phys, Sherbrooke, PQ J1K 2R1, Canada
[4] Univ Sherbrooke, Regrp Quebecois Mat Pointe, Sherbrooke, PQ J1K 2R1, Canada
来源
关键词
quantum devices; telegraph noise; bias cooling;
D O I
10.1016/j.physe.2006.03.118
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We have studied at low temperatures the switching (telegraph) noise in quantum point contacts fabricated on GaAs/AlGaAs heterostructures and introduce a model for its origin which explains why the noise can be suppressed by cooling the samples with a positive bias applied to the gates. This model depends on there being a small tunnel current of electrons from gate to channel and we have detected such a current at the level of 10(-20) A using a quantum corral fabricated on similar material. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:553 / 556
页数:4
相关论文
共 50 条
  • [1] Origin of switching noise in GaAs/AlxGa1-xAs lateral gated devices -: art. no. 115331
    Pioro-Ladrière, M
    Davies, JH
    Long, AR
    Sachrajda, AS
    Gaudreau, L
    Zawadzki, P
    Lapointe, J
    Gupta, J
    Wasilewski, Z
    Studenikin, S
    PHYSICAL REVIEW B, 2005, 72 (11)
  • [2] NOISE TEMPERATURE MODELING OF ALGAAS/GAAS AND ALGAAS/INGAAS/GAAS HEMTS
    ANWAR, AFM
    LIU, KW
    SOLID-STATE ELECTRONICS, 1994, 37 (09) : 1585 - 1588
  • [3] Switching characteristics and demonstration of logic functions in modulation doped GaAs/AlGaAs nanoelectronic devices
    Reitzenstein, S
    Worschech, L
    Kesselring, M
    Forchel, A
    PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2002, 13 (2-4): : 954 - 956
  • [4] STRUCTURE AND LATERAL DIFFUSION OF OHMIC CONTACTS IN ALGAAS/GAAS HIGH ELECTRON-MOBILITY TRANSISTORS AND GAAS DEVICES
    LANGER, DW
    EZIS, A
    RAI, AK
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1987, 5 (04): : 1030 - 1032
  • [5] Frontside etching in GaAs/AlGaAs devices
    Lishan, D.G.
    Johnson, D.J.
    Lee, Y.S.
    Reelfs, B.H.
    Westerman, R.J.
    III-Vs Review, 2002, 15 (09) : 48 - 51
  • [6] MOMBE GAAS AND ALGAAS FOR MICROELECTRONIC DEVICES
    HERSEE, SD
    YANG, L
    KAO, M
    MARTIN, P
    MAZUROWSKI, J
    CHIN, A
    BALLINGALL, J
    JOURNAL OF CRYSTAL GROWTH, 1992, 120 (1-4) : 218 - 227
  • [7] NOISE PROPERTIES OF ALGAAS/GAAS MODFETS
    ANWAR, AFM
    LIU, KW
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1993, 40 (06) : 1174 - 1176
  • [8] LF EXCESS NOISE-ANALYSIS OF ALGAAS/GAAS AND ALGAAS/INGAAS/GAAS HEMTS
    SAYSSET, N
    MANEUX, C
    LABAT, N
    TOUBOUL, A
    DANTO, Y
    DUMAS, JM
    JOURNAL DE PHYSIQUE III, 1995, 5 (05): : 509 - 517
  • [9] GATED NONLOCAL MAGNETORESISTANCE MEASUREMENT IN A GAAS/ALGAAS HETEROSTRUCTURE
    DEUTSCHER, NF
    RYAN, JM
    FERRY, DK
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1994, 9 (07) : 1354 - 1357
  • [10] Intrinsic and extrinsic origins of low-frequency noise in GaAs/AlGaAs Schottky-gated nanostructures
    Hitachi, Kenichi
    Ota, Takeshi
    Muraki, Koji
    APPLIED PHYSICS LETTERS, 2013, 102 (19)