Analysis and testing of analog and mixed-signal circuits by an operation-region model

被引：0

作者：

Miura, Y ^{[1
]}

机构：

[1] Tokyo Metropolitan Univ, Grad Sch Engn, Hachioji, Tokyo 1920397, Japan

来源：

IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS | 2002年 / E85D卷 / 10期

关键词：

abstract circuit model; analog and mixed-signal circuits; analysis and testing; CMOS circuits; operation regions;

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

This paper proposes an operation-region model for analyzing and testing analog and mixed-signal circuits, which is based on observation of change in MOSFET operation regions. First, the relation between the change in MOSFET operation regions and the fault behavior of a mixed-signal circuit containing a bridging fault is investigated. Next, we propose an analysis procedure based on the operation-region model and apply it to generate the optimal input combination for testing the circuit. We also determine which transistors should be observed in order to estimate the circuit behavior. Since the operation-region model is a method for modeling circuit behavior abstractly, the proposed method will be useful for modeling circuit behavior and for analyzing and testing many kinds of analog and mixed-signal circuits.

引用

页码：1551 / 1557

页数：7

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