Test Port Cable Instability and VNA Measurement Errors

被引：0
|
作者：
Liu, James C. [1 ]
Wong, Ken [1 ]
机构：
[1] Agilent Technol, Santa Rosa, CA 95403 USA
来源：
2013 81ST ARFTG MICROWAVE MEASUREMENT CONFERENCE (ARFTG) | 2013年
关键词：
VNA; measurement errors; cable instability; error correction; calibration;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Test port cables are often analyzed to determine the quality of their stability performance. However, the actual impact of their instability often is overlooked or not accounted properly. Cable stability measurements using traditional methods, such as using a short, do not correlate to the impact of cable instability on DUT measurements. An alternative method is presented that use ECal to analyze cable stability that provides a greater degree of insight on how DUT measurements are impacted by cable instability. In addition, methods to minimize the impact of cable instability are examined.
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收藏
页数：8
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