Probabilistic testability measure before pseudorandom test generation

被引：0

作者：

Kaminska, M. O. ^{[1
]}

Kulak, E. N. ^{[1
]}

Guz, O. A. ^{[1
]}

Yeliseev, V. V. ^{[2
]}

机构：

[1] Kharkov Natl Univ Radio Elect, Design Automat Dept, UA-61166 Kharkov, Ukraine

[2] N Donetsk Technol Univ, UA-93400 Kharkov, Ukraine

来源：

PROCEEDINGS OF THE INTERNATIONAL CONFERENCE MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 2006年

关键词：

controllability; observability; testability; probability;

D O I：

10.1109/MIXDES.2006.1706649

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

It is proposed more suitable method of the testability analysis of the digital systems in comparison with known classical algorithmic and probabilistic methods. It is oriented on the complex combinational and sequential asynchronous logic circuits. Estimation of the testability is based on the topological analysis of the circuit. The new method and above mentioned methods were approved on the circuits of different complexity, including circuits from ISCAS'85, '89 Libraries. Proposed method can be used on gate-level and RT-level circuit description. http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=1706649

引用

页码：591 / +

页数：2

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