Dichroism in the photoionisation of atoms at XUV free-electron lasers

被引:5
|
作者
Mazza, T. [1 ]
Gryzlova, E. V. [2 ]
Grum-Grzhimailo, A. N. [2 ]
Kazansky, A. K. [3 ,4 ,5 ]
Kabachnik, N. M. [1 ,2 ,5 ]
Meyer, M. [1 ]
机构
[1] European XFEL GmbH, D-22761 Hamburg, Germany
[2] Moscow MV Lomonosov State Univ, Skobeltsyn Inst Nucl Phys, Moscow 119991, Russia
[3] Univ Basque Country, Dept Fis Mat, E-20018 San Sebastian, Spain
[4] Basque Fdn Sci, Ikerbasque, E-48011 Bilbao, Spain
[5] Donostia Int Phys Ctr DIPC, E-20018 San Sebastian, Spain
关键词
Photoemission from atoms; Multiphoton ionization; Two-color ionization; Dichroism; Free-electron lasers; MULTIPHOTON IONIZATION; ULTRAVIOLET; INVERSION; OPERATION; FIELD;
D O I
10.1016/j.elspec.2015.08.011
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
Two-color photoionization of atomic He has been investigated by angle-integrated and angle-resolved electron spectroscopy. The combined action of intense radiation pulses from the XUV free-electron laser (FEL), FERMI or FLASH, and a synchronized optical laser on the target atom gives rise to a rich side-band structure in the photoemission spectrum. Measurements of the angular distribution parameters and the determination of the circular and linear dichroism for the two-color photoionization enable a detailed analysis of the symmetry of the outgoing electron waves and of the dynamics underlying the multi-photon processes. The experimental results are in excellent agreement with theoretical results obtained using perturbation theory (low intensity regime) and the strong field approximation. For the particular case of two-photon ionization the measurements represent an ideal tool for characterizing certain FEL parameters, here for example the degree and the sign of circular polarization. Finally, new features of the dichroism are theoretically predicted originating from the non-dipole contribution into the photoionization amplitudes. (C) 2015 Elsevier B.V. All rights reserved.
引用
收藏
页码:313 / 321
页数:9
相关论文
共 50 条
  • [31] UNDULATORS AND FREE-ELECTRON LASERS
    MOTZ, H
    [J]. CONTEMPORARY PHYSICS, 1979, 20 (05) : 547 - 568
  • [32] TUNABILITY OF FREE-ELECTRON LASERS
    WONG, RK
    COLSON, WB
    [J]. PHYSICAL REVIEW E, 1995, 52 (01): : 981 - 985
  • [33] The FERMI free-electron lasers
    Allaria, E.
    Badano, L.
    Bassanese, S.
    Capotondi, F.
    Castronovo, D.
    Cinquegrana, P.
    Danailov, M. B.
    D'Auria, G.
    Demidovich, A.
    De Monte, R.
    De Ninno, G.
    Di Mitri, S.
    Diviacco, B.
    Fawley, W. M.
    Ferianis, M.
    Ferrari, E.
    Gaio, G.
    Gauthier, D.
    Giannessi, L.
    Iazzourene, F.
    Kurdi, G.
    Mahne, N.
    Nikolov, I.
    Parmigiani, F.
    Penco, G.
    Raimondi, L.
    Rebernik, P.
    Rossi, F.
    Roussel, E.
    Scafuri, C.
    Serpico, C.
    Sigalotti, P.
    Spezzani, C.
    Svandrlik, M.
    Svetina, C.
    Trovo, M.
    Veronese, M.
    Zangrando, D.
    Zangrando, M.
    [J]. JOURNAL OF SYNCHROTRON RADIATION, 2015, 22 : 485 - 491
  • [34] FREE-ELECTRON LASERS IN EUROPE
    ORTEGA, JM
    [J]. OPTICA ACTA, 1985, 32 (9-10): : 1089 - 1103
  • [35] PROSPECTIVES OF FREE-ELECTRON LASERS
    GOVER, A
    YARIV, A
    YEH, P
    [J]. OPTICS COMMUNICATIONS, 1976, 18 (02) : 221 - 222
  • [36] FREE-ELECTRON LASERS AND THEIR APPLICATIONS
    DOBIASCH, P
    HOHLA, KL
    MEYSTRE, P
    [J]. OPTICS AND LASERS IN ENGINEERING, 1983, 4 (02) : 91 - 119
  • [37] MEDIA FREE-ELECTRON LASERS
    PIESTRUP, MA
    FAUCHET, AM
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 1984, 1 (03) : 531 - 531
  • [38] PARAMETRIC FREE-ELECTRON LASERS
    BESSONOV, EG
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1989, 282 (2-3): : 442 - 444
  • [39] THEORY OF FREE-ELECTRON LASERS
    SPRANGLE, P
    SMITH, RA
    [J]. PHYSICAL REVIEW A, 1980, 21 (01): : 293 - 301
  • [40] Photonic Free-Electron Lasers
    van der Slot, P. J. M.
    Denis, T.
    Lee, J. H. H.
    van Dijk, M. W.
    Boller, K. J.
    [J]. IEEE PHOTONICS JOURNAL, 2012, 4 (02): : 570 - 573