Measuring Dynamic Phenomena at the Sub-micron Scale

被引：1

作者：

Soria, Julio ^{[1
]}

Amili, Omid ^{[1
]}

Atkinson, Callum ^{[1
]}

机构：

[1] Monash Univ, Dept Mech & Aerosp Engn, LTRAC, Melbourne, Vic 3800, Australia

来源：

2008 INTERNATIONAL CONFERENCE ON NANOSCIENCE AND NANOTECHNOLOGY | 2008年

关键词：

sub-micron phenomena; holography; PIV; dynamics;

D O I：

10.1109/ICONN.2008.4639263

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

measuring the spatio-temporal evolution of dynamic phenomena at sub-micron level is non-trivial due to the diffraction limit of optical systems. This paper describes a technique which allows imaging of sub-micron features of fluid-based phenomena, specifically the determination of their velocity and trajectory.

引用

页码：129 / 132

页数：4

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