Evaluation of field electron emitter fabricated using focused-ion-beam chemical vapor deposition

被引:25
|
作者
Kometani, Reo
Kanda, Kazuhiro
Haruyama, Yuichi
Kaito, Takashi
Matsui, Shinji
机构
[1] Univ Hyogo, Grad Sch Sci, Ako, Hyogo 6781205, Japan
[2] CREST, Japan Sci & Technol Agcy, Kawaguchi, Saitama 3320012, Japan
[3] JSPS, Japan Soc Promot Sci, Chiyoda Ku, Tokyo 1028472, Japan
[4] SII Nanotechnol Inc, Shizuoka 4101393, Japan
关键词
field electron emitter; focused-ion-beam chemical vapor deposition (FIB-CVD); three-dimensional (3-D) structure; diamond-like carbon (DLC); nano-tool;
D O I
10.1143/JJAP.45.L711
中图分类号
O59 [应用物理学];
学科分类号
摘要
We carried out the field-emission characterization of materials, such as diamond-like carbon (DLC), W, and Fe, deposited by focused-ion-beam chemical vapor deposition (FIB-CVD) to develop a field emitter to be used as a nano-tool for spot deposition. As a result, the threshold voltage of the field emission from the DLC was lower than those from the W and Fe. In addition, we measured the work functions of the se materials using photoelectron spectroscopy and found that DLC has a low work function. Furthermore, a field emitter with a DLC tip as a cold cathode was fabricated on a glass capillary, because it was found to be able to emit electrons from the DLC using a low voltage. We also confirmed that electrons were emitted from a DLC tip fabricated by FIB-CVD.
引用
收藏
页码:L711 / L713
页数:3
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