Coherent X-ray diffraction imaging of strain at the nanoscale

被引：7
|
作者：
Robinson, Ian [1 ,2 ]
Harder, Ross [3 ]
机构：
[1] UCL, London Ctr Nanotechnol, London WC1H 0AH, England
[2] Diamond Light Source, Didcot OX11 0DE, Oxon, England
[3] Adv Photon Source, Argonne, IL 60439 USA
来源：
NATURE MATERIALS | 2009年 / 8卷 / 04期
基金：
英国工程与自然科学研究理事会; 美国国家科学基金会;
关键词：
STRUCTURAL MICROSCOPY; RESOLUTION; PHASE; CRYSTALLOGRAPHY; NANOCRYSTALS; ALGORITHMS; GROWTH;
D O I：
10.1038/nmat2400
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The understanding and management of strain is of fundamental importance in the design and implementation of materials. The strain properties of nanocrystalline materials are different from those of the bulk because of the strong influence of their surfaces and interfaces, which can be used to augment their function and introduce desirable characteristics. Here we explain how new X-ray diffraction techniques, which take advantage of the latest synchrotron radiation sources, can be used to obtain quantitative three-dimensional images of strain. These methods will lead, in the near future, to new knowledge of how nanomaterials behave within active devices and on unprecedented timescales.
引用
收藏
页码：291 / 298
页数：8
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