Auger electron nanoscale mapping and x-ray photoelectron spectroscopy combined with gas cluster ion beam sputtering to study an organic bulk heterojunction

被引：7

作者：

Kim, Seong Heon ^{[1
]}

Heo, Sung ^{[1
]}

Ihn, Soo-Ghang ^{[1
]}

Yun, Sungyoung ^{[1
]}

Park, Jong Hwan ^{[1
]}

Chung, Yeonji ^{[1
]}

Lee, Eunha ^{[1
]}

Park, Gyeongsu ^{[1
]}

Yun, Dong-Jin ^{[1
]}

机构：

[1] Samsung Adv Inst Technol, Gyeonggi Do 443803, South Korea

来源：

APPLIED PHYSICS LETTERS | 2014年 / 104卷 / 24期

关键词：

POLYMER PHOTOVOLTAIC CELLS; SELF-ORGANIZATION; CHARGE-TRANSPORT; SOLAR-CELLS; EFFICIENCY; MORPHOLOGY; NETWORK;

D O I：

10.1063/1.4885115

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The lateral and vertical distributions of organic p/n bulk heterojunctions for an organic solar cell device are, respectively, investigated using nanometer-scale Auger electron mapping and using X-ray photoelectron spectroscopy (XPS) with Ar gas cluster ion beam (GCIB) sputtering. The concentration of sulfur, present only in the p-type material, is traced to verify the distribution of p-type (donor) and n-type (acceptor) materials in the blended structure. In the vertical direction, a considerable change in atomic sulfur concentration is observed using XPS depth profiling with Ar GCIB sputtering. In addition, Auger electron mapping of sulfur reveals the lateral 2-dimensional distribution of p-and n-type materials. The combination of Auger electron mapping with Ar GCIB sputtering should thereby allow the construction of 3-dimensional distributions of p-and n-type materials in organic photovoltaic cells. (C) 2014 AIP Publishing LLC.

引用

页数：4

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