CHARACTERIZATION OF SILVER CONTENT UPON PROPERTIES OF NANOSTRUCTURED NICKEL OXIDE THIN FILMS

被引：0

作者：

Salloom, H. T. ^{[1
]}

Hadi, E. H. ^{[2
]}

Habubi, N. F. ^{[2
]}

Chiad, S. S. ^{[2
]}

Jadan, M. ^{[3
]}

Addasi, J. S. ^{[4
]}

机构：

[1] Al Nahrain Univ, Al Nahrain Nanorenewable Energy Res Ctr, Baghdad, Iraq

[2] Mustansiriyah Univ, Coll Educ, Dept Phys, Baghdad, Iraq

[3] Imam Abdulrahman Bin Faisal Univ, Coll Sci, Dept Phys, POB 1982, Dammam 31441, Saudi Arabia

[4] Tafila Tech Univ, Coll Sci, Dept Appl Phys, Tafila 66110, Jordan

来源：

DIGEST JOURNAL OF NANOMATERIALS AND BIOSTRUCTURES | 2020年 / 15卷 / 04期

关键词：

Silver-doped nickel oxide; Optical properties; X-ray diffraction; Photovoltaic; Thin films; ELECTRICAL-PROPERTIES; URBACH ENERGY; NIO; TAIL;

D O I：

暂无

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The influence of two silver contents (2% and 4%) on NiO films were studied in terms of structural and optical properties. Ag doped NiO films were grown on glass and n-type silicon substrates heated at 400 degrees C by chemical pyrolysis method. Optical transmission measurements showed up to 60% transparency in the visible area for undoped NiO and decreased with increasing Ag content. X-ray diffraction assures the existence of epitaxial growth with the c-axis. Average particle size, surface roughness and energy gap were decreased also. Rectifying characteristics of junctions deposited films on n-type silicon has been analyzed. Transparent conductive films showed excellent properties to be adopted for solar cells and optical sensors.

引用

页码：1189 / 1195

页数：7

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