Goos-Hanchen shift of the reflected beam in a standing-wave coupled electromagnetically induced transparency system

被引:11
|
作者
Zhang, Xiao-Jun [1 ]
Wang, Hai-Hua [2 ]
Wang, Chun-Liang [3 ]
Xu, Yan [1 ]
Liang, Zhi-Peng [1 ]
Fan, Cun-Bo [1 ]
Liu, Cheng-Zhi [1 ]
Gao, Jin-Yue [2 ]
机构
[1] Chinese Acad Sci, Natl Astron Observ, Changchun Observ, Changchun 130117, Peoples R China
[2] Jilin Univ, Coll Phys, Changchun 130023, Peoples R China
[3] NE Normal Univ, Sch Phys, Changchun 130024, Peoples R China
基金
中国国家自然科学基金;
关键词
HIGH-SENSITIVITY; LATERAL SHIFT; GIANT; LIGHT; DISPLACEMENT; MODE;
D O I
10.1364/JOSAB.32.002281
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The Goos-Hanchen shift of the reflected beam in a standing-wave coupled electromagnetically induced transparency medium is investigated. We adopt the three-level. system as a model of Rb-87 atomic media. Under the influence of two counterpropagating coupling fields, the incident beam is converted into a reflected one, with the Goos-Hanchen shift. We briefly discuss the rules for obtaining efficient reflection in such an atomic system, and carefully investigate the Goos-Hanchen shift and its dependence on the beam width of the incident field. Both the cases with and without Doppler broadening are considered. In order to provide a clearer physical picture on the large shift that could be realized, the concept of penetration depth is used to analyze the shift phenomeno-logically. (C) 2015 Optical Society of America
引用
收藏
页码:2281 / 2287
页数:7
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