X-RAY STUDY OF COMPOUNDS OF HYPERVALENT SILICON

被引：0
|
作者：
Zelbst, E. A. [1 ]
Kashaev, A. A. [1 ]
Demidov, M. P. [2 ]
Voronkov, M. G. [2 ]
机构：
[1] Pedag Univ, Phys Fac, Irkutsk, Russia
[2] Academ Nauk Russia, Inst Chem, Irkutsk, Russia
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 1999年 / 55卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
P13.07.003
引用
收藏
页码：438 / 438
页数：1
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