Registration of Eight Soybean Germplasm Lines Resistant to Soybean Rust

被引:10
|
作者
Diers, Brian W. [1 ]
Kim, Ki-Seung [1 ]
Frederick, Reid D. [2 ]
Hartman, Glen L. [3 ]
Unfried, Jair [1 ]
Schultz, Sarah [1 ]
Cary, Troy [1 ]
机构
[1] Univ Illinois, Dept Crop Sci, Urbana, IL 61801 USA
[2] USDA ARS, Foreign Dis Weed Sci Res Unit, Ft Detrick, MD 21702 USA
[3] Univ Illinois, Dept Crop Sci, USDA ARS, Soybean Maize Germplasm Pathol & Genet Res Unit, Urbana, IL 61801 USA
关键词
PHAKOPSORA-PACHYRHIZI; CONFERS RESISTANCE; UNITED-STATES; MARKERS; LOCUS; CONFIRMATION; GENES; RPP1;
D O I
10.3198/jpr2012.11.0052crg
中图分类号
S3 [农学(农艺学)];
学科分类号
0901 ;
摘要
Soybean rust (SBR; caused by Phakopsora pachyrhizi Sydow) is a threat to soybean [Glycine max (L.) Merr.] production worldwide. Although SBR has not caused widespread damage in North America, the crop is still threatened by the disease because most cultivars in production are susceptible. We backcrossed the SBR-resistance genes Rpp1, Rpp1-b, Rpp?(Hyuuga), and Rpp5 into the maturity group (MG) II experimental line LD01-7323 and the MG IV cultivar LD00-3309 to develop Midwest-adapted soybean germplasm with SBR resistance. The backcross lines were tested for SBR resistance in greenhouse tests and for agronomic traits in multilocation field tests. The four MG II soybean germplasm lines LD10-30052 (Reg. No. GP-383, PI 668384), LD10-14321 (Reg. No. GP-384, PI 668385), LD10-14284 (Reg. No. GP-385, PI 668386), and LD09-16057 (Reg. No. GP-386, PI 668387) and the four MG IV germplasm lines LD10-14205 (Reg. No. GP-389, PI 668390), LD10-13091 (Reg. No. GP-387, PI 668388), LD10-14274 (Reg. No. GP-388, PI 668389), and 08RST5-10 (Reg. No. GP-390, PI 668391) developed through these efforts were released by the Illinois Agricultural Experiment Station in April 2012. The lines carry SBR resistance genes and are indistinguishable from the recurrent parents for morphological traits and, with only a few exceptions, are not significantly different than their recurrent parents for agronomic traits including seed yield. These lines should be useful to soybean breeders who wish to develop rust-resistant cultivars.
引用
收藏
页码:96 / 101
页数:6
相关论文
共 50 条
  • [31] REGISTRATION OF SOYBEAN GERMPLASM LINE LN89-5612, MODERATELY RESISTANT TO SOYBEAN CYST-NEMATODE
    NICKELL, CD
    NOEL, GR
    BERNARD, RL
    THOMAS, DJ
    PRACHT, J
    CROP SCIENCE, 1994, 34 (04) : 1134 - 1135
  • [32] Registration of LS-G96 soybean germplasm resistant to soybean sudden death syndrome and soybean cyst nematode race 3
    Schmidt, ME
    Suttner, RJ
    Klein, JH
    Gibson, PT
    Lightfoot, DA
    Myers, O
    CROP SCIENCE, 1999, 39 (02) : 598 - 598
  • [33] Soybean Germplasm Accession Seedling Reactions to Soybean Rust Isolates from Georgia
    Walker, David R.
    Harris, Donna K.
    King, Zachary R.
    Li, Zenglu
    Phillips, Daniel V.
    Buck, James W.
    Nelson, Randall L.
    Boerma, H. Roger
    CROP SCIENCE, 2014, 54 (04) : 1433 - 1447
  • [34] REGISTRATION OF HM1 PHYTOPHTHORA ROOT-RESISTANT SOYBEAN GERMPLASM
    MCBLAIN, BA
    SCHMITTHENNER, AF
    ZIMMERLY, MM
    CARSON, SJ
    HACKER, JK
    FIORITTO, RJ
    COOPER, RL
    MARTIN, RJ
    CROP SCIENCE, 1992, 32 (03) : 836 - 837
  • [35] Registration of Soybean Germplasm JTN-5303
    Arelli, P. R.
    Pantalone, V. R.
    Allen, F. L.
    Mengistu, A.
    JOURNAL OF PLANT REGISTRATIONS, 2007, 1 (01) : 69 - 70
  • [36] REGISTRATION OF SG1 SOYBEAN GERMPLASM
    SPECHT, JE
    WILLIAMS, JH
    KENWORTHY, WJ
    ORF, JH
    HELSEL, DG
    STMARTIN, SK
    CROP SCIENCE, 1985, 25 (04) : 717 - 718
  • [37] REGISTRATION OF A GERMPLASM LINE OF SOYBEAN, A7
    FEHR, WR
    VOSS, BK
    DECIANZIO, SR
    CROP SCIENCE, 1984, 24 (02) : 390 - 391
  • [38] REGISTRATION OF HW79149 SOYBEAN GERMPLASM
    WALKER, AK
    SCHMITTHENNER, AF
    CROP SCIENCE, 1984, 24 (01) : 214 - 214
  • [39] REGISTRATION OF A6-GERMPLASM LINE OF SOYBEAN
    HAMMOND, EG
    FEHR, WR
    CROP SCIENCE, 1983, 23 (01) : 192 - 193
  • [40] Registration of 64 soybean germplasm lines with all combinations of five soybean aphid resistance genes in two genetic backgrounds
    Diers, Brian W.
    Lagos-Kutz, Doris M.
    Schultz, Sarah J.
    Cary, Troy
    Wang, Dechun
    Hartman, Glen L.
    JOURNAL OF PLANT REGISTRATIONS, 2023, 17 (02) : 416 - 425