Soft X-ray emission from preionized He plasma in a 3.3 kJ Mather type plasma focus device

被引：1

作者：

Khan, H. U. ^{[1
]}

Shafiq, M. ^{[1
]}

Hussain, S. S. ^{[1
]}

Ahmad, S. ^{[2
]}

Zakaullah, M. ^{[1
]}

机构：

[1] Quaid I Azam Univ, Dept Phys, Islamabad 45320, Pakistan

[2] Natl Tokamak Fus Program, Islamabad, Pakistan

来源：

PLASMA DEVICES AND OPERATIONS | 2009年 / 17卷 / 04期

关键词：

soft X-ray; plasma focus; preionization; PUFF Z-PINCH; DENSE-PLASMA; LITHOGRAPHY; ARGON; ENHANCEMENT; YIELD; NEON;

D O I：

10.1080/10519990903151541

中图分类号：

TL [原子能技术]; O571 [原子核物理学];

学科分类号：

0827 ; 082701 ;

摘要：

Soft X-ray emission from He plasma in a 3.3 kJ plasma focus system is investigated without and with preionization by a particles. Silicon PIN diodes and a multi-pinhole camera with absorption filters are employed for time-resolved and time-integrated X-ray analyzes, respectively. X-ray emission in 4 pi geometry is measured as a function of He gas filling pressures. The highest soft X-ray yield, of 0.25 +/- 0.01 J, is obtained at a filling pressure of 125 Pa without preionization, which increases to 0.50 +/- 0.02 J with preionization at a filling pressure of 150 Pa. The total X-ray yield without preionization, 1.50 +/- 0.07 J, is observed at a filling pressure of 125 Pa and this is enhanced to 2.44 +/- 0.11 J with preionization at a filling pressure of 150 Pa. The preionization makes the focus filament symmetric and enhances its volume.

引用

页码：257 / 264

页数：8

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