deep-level transient spectroscopy;
quantum dots;
infrared photodetectors;
InAs/InGaAs/GaAs;
energy level;
D O I:
暂无
中图分类号:
O4 [物理学];
学科分类号:
0702 ;
摘要:
We studied the energy-band structure of InAs/InGaAs/GaAs quantum-dot infrared photodetector (QDIP) with dot-in-a-well structure by performing deep-level transient spectroscopy (DLTS) and photoluminescence measurements. The confined energy levels of InAs/InGaAs quantum dot and the InGaAs/GaAs quantum well in the dot-in-a-well QDIP structure were analyzed. DLTS revealed activation energies of 352 meV and 125 meV, which originated from the confined levels of the quantum dot and quantum well, respectively. These energy levels were also identified as 290 meV and 150 meV in PL measurements, respectively, based on the PL measurements.
机构:
Univ Michigan, Dept Elect Engn & Comp Sci, Solid State Elect Lab, Ann Arbor, MI 48109 USAUniv Michigan, Dept Elect Engn & Comp Sci, Solid State Elect Lab, Ann Arbor, MI 48109 USA
Su, XH
Chakrabarti, S
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机构:Univ Michigan, Dept Elect Engn & Comp Sci, Solid State Elect Lab, Ann Arbor, MI 48109 USA
Chakrabarti, S
Bhattacharya, P
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机构:Univ Michigan, Dept Elect Engn & Comp Sci, Solid State Elect Lab, Ann Arbor, MI 48109 USA
Bhattacharya, P
Ariyawansa, G
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机构:Univ Michigan, Dept Elect Engn & Comp Sci, Solid State Elect Lab, Ann Arbor, MI 48109 USA
Ariyawansa, G
Perera, AGU
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机构:Univ Michigan, Dept Elect Engn & Comp Sci, Solid State Elect Lab, Ann Arbor, MI 48109 USA
机构:
Univ Michigan, Dept Elect Engn & Comp Sci, Solid State Elect Lab, Ann Arbor, MI 48109 USAUniv Michigan, Dept Elect Engn & Comp Sci, Solid State Elect Lab, Ann Arbor, MI 48109 USA
Stiff, AD
Krishna, S
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机构:Univ Michigan, Dept Elect Engn & Comp Sci, Solid State Elect Lab, Ann Arbor, MI 48109 USA
Krishna, S
Bhattacharya, P
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机构:Univ Michigan, Dept Elect Engn & Comp Sci, Solid State Elect Lab, Ann Arbor, MI 48109 USA
Bhattacharya, P
Kennerly, SW
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机构:Univ Michigan, Dept Elect Engn & Comp Sci, Solid State Elect Lab, Ann Arbor, MI 48109 USA