Temperature driven structural evolution of Ge-rich GeSbTe alloys and role of N-doping

被引:20
|
作者
Prazakova, L. [1 ]
Nolot, E. [1 ]
Martinez, E. [1 ]
Fillot, F. [1 ]
Rouchon, D. [1 ]
Rochat, N. [1 ]
Bernard, M. [1 ]
Sabbione, C. [1 ]
Morel, D. [1 ]
Bernier, N. [1 ]
Grenier, A. [1 ]
Papon, A-M [1 ]
Cyrille, M-C [1 ]
Navarro, G. [1 ]
机构
[1] Univ Grenoble Alpes, LETI, CEA, F-38000 Grenoble, France
关键词
THIN-FILMS; RAMAN-SCATTERING; CRYSTALLIZATION; GE2SB2TE5; GERMANIUM; MECHANISM; NITROGEN; SEGREGATION; TRANSITION;
D O I
10.1063/5.0027734
中图分类号
O59 [应用物理学];
学科分类号
摘要
Ge-rich GeSbTe alloys allowed overcoming temperature limitations of phase-change memory technology. In this paper, we present a thorough investigation of the structural evolution and the crystallization process of these alloys as a function of increasing temperature in annealing. We highlight the progressive rearrangement of the structure toward the demixing of Ge and GeSbTe phases. In particular, we show the stability of Sb-Te units and the development of Ge-Te bonds around these features. We observe the formation of a transient GeSbTe phase, which is driven by crystallization phenomena, leading to a gradual diffusion and expulsion of Ge. Therefore, the system moves toward the complete separation of Ge and Ge2Sb2Te5 stable phases. Furthermore, we investigate the effect of N-doping in Ge-rich GeSbTe, which induces the formation of Ge-N bonds. Such features are demonstrated to be responsible for a delayed structural reorganization to higher temperatures, thus affecting the entire process of crystallization and phase separation in the alloy.
引用
收藏
页数:10
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