Initial assessment of multilayer silicon detectors for hard X-ray imaging

被引：3

作者：

Li, Xuan ^{[1
]}

Chu, Pinghan ^{[1
]}

Wang, Zhehui ^{[1
]}

O'Shaughnessy, Christopher M. ^{[1
]}

Morris, Chris ^{[1
]}

Demarteau, Marcel ^{[2
]}

Wagner, Robert ^{[2
]}

Xie, Junqi ^{[2
]}

Xia, Lei ^{[2
]}

Zhu, Ren-Yuan ^{[3
]}

Zhang, Liyuan ^{[3
]}

Hu, Chen ^{[3
]}

Adams, Bernhard ^{[4
]}

Katsoudas, John ^{[5
]}

Ding, Yujia ^{[5
]}

Segre, Carlo ^{[5
]}

Smith, Thomas A. ^{[6
]}

Shih, Yanhua ^{[6
]}

机构：

[1] Los Alamos Natl Lab, Phys Div, Los Alamos, NM 87545 USA

[2] Argonne Natl Lab, High Energy Phys Div, Lemont, IL 60439 USA

[3] CALTECH, Phys Dept, Pasadena, CA 91125 USA

[4] Incom Inc, Charlton, MA 01507 USA

[5] IIT, Chicago, IL 60616 USA

[6] Univ Maryland Baltimore Cty, Baltimore, MD 21250 USA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2019年 / 942卷

关键词：

Silicon detector; Multilayer; Hard X-ray imaging;

D O I：

10.1016/j.nima.2019.162414

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Silicon detectors with lower material budget, ultrafast readout and radiation hardness are under developments. These unique features make pixelized silicon sensors a good option for hard X-ray imaging. To verify the performance of spatial resolution and energy sensitivity of silicon sensors to hard X-rays, a two layer setup of Pixelink PL-D725MU sensors has been tested at the Argonne National Laboratory Advanced Photon Source (APS) ID-10 sector with 29.2 keV high photon flux (4.5 x 10(8) to 4.5 x 10(10) photons per second) X-rays. Better than 3 mu m spatial resolution and clear energy characterization have been achieved by both layers. Commercial CMOS sensors with superior spatial resolution could be used for phase contrast imaging in current synchrotrons. These studies pave the path for future multilayer ultrafast silicon sensor development with ns to sub-ns readout speeds in hard X-ray imaging at synchrotrons and XFEL beamlines.

引用

页数：8

共 50 条

[1] Multilayer Zone Plates for Hard X-ray Imaging
Osterhoff, Markus
Krebs, Hans-Ulrich
NANOSCALE PHOTONIC IMAGING, 2020, 134 : 561 - 581
[2] X-ray silicon detectors for measuring hard X-ray radiation damage effects
Wagner, D
Halmagean, E
Loukas, D
Misiakos, K
Tsoi, E
Veron, A
Ohanisian, M
HARD X-RAY AND GAMMA-RAY DETECTOR PHYSICS, OPTICS, AND APPLICATIONS, 1997, 3115 : 296 - 304
[3] SENSITIVITY OF STACKED IMAGING DETECTORS TO HARD X-RAY POLARIZATION
Muleri, Fabio
Campana, Riccardo
ASTROPHYSICAL JOURNAL, 2012, 751 (02):
[4] Hard X-ray and Gamma-ray Imaging and Spectroscopy using Scintillators coupled to Silicon Drift Detectors
Lechner, P.
Eckhard, R.
Fiorini, C.
Gola, A.
Longoni, A.
Niculae, A.
Peloso, R.
Soltau, H.
Strueder, L.
HIGH ENERGY, OPTICAL, AND INFRARED DETECTORS FOR ASTRONOMY III, 2008, 7021
[5] Multipixel characterization of imaging CZT detectors for hard X-ray imaging and spectroscopy
Vadawale, SV
Hong, J
Grindlay, J
Williams, P
Zhang, M
Bellm, E
Narita, T
Craig, W
Parker, B
Stahle, C
Yan, F
HARD X-RAY AND GAMMA-RAY DETECTOR PHYSICS VI, 2004, 5540 : 22 - 32
[6] Dark current in multilayer amorphous selenium x-ray imaging detectors
Mahmood, S. A.
Kabir, M. Z.
Tousignant, O.
Mani, H.
Greenspan, J.
Botka, P.
APPLIED PHYSICS LETTERS, 2008, 92 (22)
[7] X-RAY imaging detectors
Gruner, Sol M.
PHYSICS TODAY, 2012, 65 (12) : 29 - 34
[8] Imaging hard X-ray microscopy with a multilayer Fresnel zone plate
Awaji, M
Suzuki, Y
Takeuchi, A
Kamijo, N
Tamura, S
Yasumoto, M
Kohmura, Y
X-RAY MICROSCOPY, PROCEEDINGS, 2000, 507 : 545 - 548
[9] Hard X-ray and γ-ray detectors for the NeXT mission
Takahashi, T
Makishima, K
Fukazawa, Y
Kokubun, M
Nakazawa, K
Nomachi, M
Tajima, H
Tashiro, M
Terada, Y
NEW ASTRONOMY REVIEWS, 2004, 48 (1-4) : 269 - 273
[10] X-ray irradiation of silicon detectors
Chmill, V.
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2006, 566 (02): : 722 - 726

← 1 2 3 4 5 →