Optimal simple step stress accelerated life test design for reliability prediction

被引:59
|
作者
Fard, Nasser [1 ]
Li, Chenhua [1 ]
机构
[1] Northeastern Univ, Dept Mech & Ind Engn, Boston, MA 02115 USA
关键词
Step stress accelerated life testing; Weibull; Failure data; Censoring; Reliability; Hold time; MODEL;
D O I
10.1016/j.jspi.2008.05.046
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
A step stress accelerated life testing model is presented to obtain the optimal hold time at which the stress level is changed. The experimental test is designed to minimize the asymptotic variance of reliability estimate at time zeta. A Weibull distribution is assumed for the failure time at any constant stress level. The scale parameter of the Weibull failure time distribution at constant stress levels is assumed to be a log-linear function of the stress level. The maximum likelihood function is given for the step stress accelerated life testing model with Type I censoring, from which the asymptotic variance and the Fisher information matrix are obtained. An optimal test plan with the minimum asymptotic variance of reliability estimate at time is determined. (C) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码:1799 / 1808
页数:10
相关论文
共 50 条
  • [11] Inference and optimal design on step-stress partially accelerated life test for hybrid system with masked data
    SHI Xiaolin
    LU Pu
    SHI Yimin
    Journal of Systems Engineering and Electronics, 2018, 29 (05) : 1089 - 1100
  • [12] Robust Designs of Step-Stress Accelerated Life Testing Experiments for Reliability Prediction
    Xu, Xiaojian
    Hunt, Scott
    MATEMATIKA, 2013, 29 (01) : 203 - 212
  • [13] Inference and optimal design on step-stress partially accelerated life test for hybrid system with masked data
    Shi Xiaolin
    Lu Pu
    Shi Yimin
    JOURNAL OF SYSTEMS ENGINEERING AND ELECTRONICS, 2018, 29 (05) : 1089 - 1100
  • [14] A Study on the Storage Reliability of LSINS Based on Step-stress Accelerated Life Test
    Teng, Fei
    Liu, Yuanyuan
    Huang, Baosheng
    INTERNATIONAL CONFERENCE ON ENGINEERING TECHNOLOGY AND APPLICATION (ICETA 2015), 2015, 22
  • [15] Reliability Assessment for LED Luminaires Based on Step-Stress Accelerated Life Test
    Gong, Ming
    Ma, Xiaosong
    Yang, Daoguo
    Cai, Miao
    Zhang, Zhen
    Ren, Rongbin
    Yang, Yu
    2012 13TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY & HIGH DENSITY PACKAGING (ICEPT-HDP 2012), 2012, : 1546 - 1549
  • [16] Optimal Plan for Step-Stress Accelerated Life Test with Two Stress Variables for Lognormal Data
    Hakamipour, Nooshin
    IRANIAN JOURNAL OF SCIENCE AND TECHNOLOGY TRANSACTION A-SCIENCE, 2018, 42 (A4): : 2259 - 2271
  • [17] Optimal Plan for Step-Stress Accelerated Life Test with Two Stress Variables for Lognormal Data
    Nooshin Hakamipour
    Iranian Journal of Science and Technology, Transactions A: Science, 2018, 42 : 2259 - 2271
  • [18] OPTIMIZING THE SIMPLE STEP STRESS ACCELERATED LIFE TEST WITH TYPE I CENSORED FRECHET DATA
    Hakamipour, Nooshin
    Rezaei, Sadegh
    REVSTAT-STATISTICAL JOURNAL, 2017, 15 (01) : 1 - 23
  • [19] Design and application of accelerated life test of grating ruler based on step stress loading
    Wang, Jili
    Li, Qingyu
    Zhu, Xiaocui
    Gao, Cheng
    Li, Yi
    Li, Guofa
    He, Jialong
    2020 2ND INTERNATIONAL CONFERENCE ON COMPUTER SCIENCE COMMUNICATION AND NETWORK SECURITY (CSCNS2020), 2021, 336
  • [20] Optimal design of simple step-stress accelerated life tests for one-shot devices under Weibull distributions
    Ling, M. H.
    Hu, X. W.
    RELIABILITY ENGINEERING & SYSTEM SAFETY, 2020, 193