Improved crystallinity of GaInNAs by additional rapid thermal annealing (RTA)

被引:0
|
作者
Kondow, M [1 ]
Kitatani, T [1 ]
Aoki, M [1 ]
Nakatsuka, S [1 ]
Kudo, M [1 ]
机构
[1] Hitachi Ltd, RWCP Optoelect Hitachi Lab, Cent Res Lab, Kokubunji, Tokyo 185, Japan
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暂无
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TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:622 / 623
页数:2
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