La0.8Ca0.2MnO3 epitaxial thin films were fabricated on SrTiO3 (100) substrates by using pulsed-laser deposition (PLD) technique. The transport behavior upon treatments by applying a large dc current has been investigated. It is found that when the applied dc current exceeds a threshold value the electric resistivity in these films could be significantly enhanced in the whole measured temperature range from 10 to 300 K. Simultaneously, abnormal electroresistance behavior appears. The enhanced resistance turns out to be sensitive to a weak current. Even a very small dc current could remarkably depress the high resistance, showing an unusual colossal ER effect. ER reaches similar to 1175% at temperatures lower than similar to 50 K, and similar to 705% at 300 K for a current changing from 0.7 to 11 mu A. Structure measurements on micro-area by micron-XRD technique were carried out. No change of the structure and lattice parameter was found upon current treatments. (c) 2005 Elsevier B.V. All rights reserved.
机构:
Univ Hong Kong, Dept Phys, Hong Kong, Hong Kong, Peoples R China
China Univ Geosci, Sch Sci, Beijing 100083, Peoples R ChinaUniv Hong Kong, Dept Phys, Hong Kong, Hong Kong, Peoples R China
Xing, Jie
Gao, Ju
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Univ Hong Kong, Dept Phys, Hong Kong, Hong Kong, Peoples R ChinaUniv Hong Kong, Dept Phys, Hong Kong, Hong Kong, Peoples R China
Gao, Ju
Wang, Le
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机构:
Chinese Acad Sci, Inst Phys, Beijing Natl Lab Condensed Matter Phys, Beijing 100190, Peoples R ChinaUniv Hong Kong, Dept Phys, Hong Kong, Hong Kong, Peoples R China
机构:
Univ Hong Kong, Dept Phys, Hong Kong, Hong Kong, Peoples R China
Chinese Acad Sci, Inst Phys, Beijing Natl Lab Condensed Matter Phys, Beijing 100190, Peoples R ChinaUniv Hong Kong, Dept Phys, Hong Kong, Hong Kong, Peoples R China
Guo, E. J.
Gao, J.
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Univ Hong Kong, Dept Phys, Hong Kong, Hong Kong, Peoples R ChinaUniv Hong Kong, Dept Phys, Hong Kong, Hong Kong, Peoples R China
Gao, J.
Lu, H. B.
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Chinese Acad Sci, Inst Phys, Beijing Natl Lab Condensed Matter Phys, Beijing 100190, Peoples R ChinaUniv Hong Kong, Dept Phys, Hong Kong, Hong Kong, Peoples R China
机构:
Dept. of Mech. Eng. and Mat. Science, Duke University, Durham, NC 27708, United StatesDept. of Mech. Eng. and Mat. Science, Duke University, Durham, NC 27708, United States
Rao, R.A.
Lavric, D.
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Dept. of Mech. Eng. and Mat. Science, Duke University, Durham, NC 27708, United StatesDept. of Mech. Eng. and Mat. Science, Duke University, Durham, NC 27708, United States
Lavric, D.
Nath, T.K.
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机构:
Dept. of Mech. Eng. and Mat. Science, Duke University, Durham, NC 27708, United StatesDept. of Mech. Eng. and Mat. Science, Duke University, Durham, NC 27708, United States
Nath, T.K.
Eom, C.B.
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Dept. of Mech. Eng. and Mat. Science, Duke University, Durham, NC 27708, United StatesDept. of Mech. Eng. and Mat. Science, Duke University, Durham, NC 27708, United States
Eom, C.B.
Wu, L.
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Department of Physics and Astronomy, University of North Carolina, Chapel Hill, NC 27599, United StatesDept. of Mech. Eng. and Mat. Science, Duke University, Durham, NC 27708, United States
Wu, L.
Tsui, F.
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Department of Physics and Astronomy, University of North Carolina, Chapel Hill, NC 27599, United StatesDept. of Mech. Eng. and Mat. Science, Duke University, Durham, NC 27708, United States
Tsui, F.
Journal of Applied Physics,
1999,
85
(8 II A):
: 4794
-
4796