Fiber-top atomic force microscope

被引：36
|
作者：
Iannuzzi, D. [1 ]
Deladi, S.
Berenschot, J. W.
de Man, S.
Heeck, K.
Elwenspoek, M. C.
机构：
[1] Vrije Univ Amsterdam, Fac Sci, Dept Phys & Astron, Amsterdam, Netherlands
[2] Univ Twente, MESA Res Inst, NL-7500 AE Enschede, Netherlands
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2006年 / 77卷 / 10期
关键词：
D O I：
10.1063/1.2358710
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
We present the implementation of an atomic force microscope (AFM) based on fiber-top design. Our results demonstrate that the performances of fiber-top AFMs in contact mode are comparable to those of similar commercially available instruments. Our device thus represents an interesting alternative to existing AFMs, particularly for applications outside specialized research laboratories, where a compact, user-friendly, and versatile tool might often be preferred. (c) 2006 American Institute of Physics.
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页数：3
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