A CMOS Pixel Sensor with 4-bit Column-Parallel Self-Triggered ADC for the ILC Vertex Detector

被引:0
|
作者
Zhang, L. [1 ]
Morel, F. [1 ]
Hu-Guo, Ch. [1 ]
Himmi, A. [1 ]
Dorokhov, A. [1 ]
Hu, Y. [1 ]
机构
[1] Univ Strasbourg, CNRS, IN2P3, Inst Pluridisciplinaire Hubert Curien, F-67037 Strasbourg, France
关键词
CHARGED-PARTICLE TRACKING;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a CMOS Pixel Sensor (CPS) prototype for the outer layers of the future International Linear Collider (ILC) vertex detector. It is composed of a matrix of 48 x 64 pixels with a 4-bit column-parallel analog-to-digital converter (ADC). The pixel concept combines in-pixel amplification with a correlated double sampling (CDS) operation in order to reduce the temporal and fixed pattern noise (FPN). The self-triggered ADC accommodating the pixel readout in a rolling shutter mode completes the conversion by performing a multi-bit/step approximation. The ADC design was optimized for power saving at sampling frequency. Accounting the fact that in the outer layers of the ILC vertex detector the hit density is in the order of a few per thousand, this ADC works in two modes: active mode and inactive mode. The average energy and total capacitance are significantly reduced by a power-gating control and a switching network, respectively. The prototype sensor was fabricated in a 0.35 mu m CMOS process with a pixel pitch of 35 mu m. The designed 4-bit ADC dissipates, at a 3-V supply and 6.25-MS/s sampling rate, 486 mu W in its inactive mode, which is by far the most frequent. This value rises to 714 mu W in case of the active mode. Its footprint amounts to 35 x 545 mu m(2).
引用
收藏
页码:929 / 932
页数:4
相关论文
共 50 条
  • [31] A 10-Bit Column-Parallel Single Slope ADC Based on Two-Step TDC with Error Calibration for CMOS Image Sensors
    Xu, Jiangtao
    Yu, Jing
    Huang, Fujun
    Nie, Kaiming
    JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS, 2015, 24 (04)
  • [32] A 12-bit compact column-parallel SAR ADC with dynamic power control technique for high-speed CMOS image sensors
    李全良
    刘力源
    韩烨
    曹中祥
    吴南健
    Journal of Semiconductors, 2014, (10) : 136 - 143
  • [33] Variable-Step 12-bit ADC based on Counter Ramp Recycling Architecture suitable for CMOS Imagers with Column-Parallel Readout
    Hassan, Tarek M.
    Strobel, Markus
    Richter, Harald
    Burghartz, Joachim N.
    2013 9TH CONFERENCE ON PH. D. RESEARCH IN MICROELECTRONICS AND ELECTRONICS (PRIME 2013), 2013, : 41 - 44
  • [34] A 12-bit compact column-parallel SAR ADC with dynamic power control technique for high-speed CMOS image sensors
    Li Quanliang
    Liu Liyuan
    Han Ye
    Cao Zhongxiang
    Wu Nanjian
    JOURNAL OF SEMICONDUCTORS, 2014, 35 (10)
  • [35] A 19-bit column-parallel folding-integration/ cyclic cascaded ADC with a pre-charging technique for CMOS image sensors
    Wang, Tongxi
    Seo, Min-Woong
    Yasutomi, Keita
    Kawahito, Shoji
    IEICE ELECTRONICS EXPRESS, 2017, 14 (02): : 1 - 12
  • [36] CMOS Flat-Panel X-ray Detector With Dual-Gain Active Pixel Sensors and Column-Parallel Readout Circuits
    Jo, Yun-Rae
    Hong, Seong-Kwan
    Kwon, Oh-Kyong
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2014, 61 (05) : 2472 - 2479
  • [37] A CMOS image sensor with 14-Bit column-parallel 3rd order incremental sigma-delta converters
    Freitas, Luis Miguel C.
    Morgado-Dias, F.
    SENSORS AND ACTUATORS A-PHYSICAL, 2020, 313
  • [38] A 14-bit column-parallel two-step SA ADC with digital calibration based on scaled references and redundancy for CMOS image sensors
    Zhelu Li
    Ning Xie
    Wei Fan
    Jianxiong Xi
    Lenian He
    Kexu Sun
    Analog Integrated Circuits and Signal Processing, 2019, 100 : 295 - 309
  • [39] A 14-bit column-parallel two-step SA ADC with digital calibration based on scaled references and redundancy for CMOS image sensors
    Li, Zhelu
    Xie, Ning
    Fan, Wei
    Xi, Jianxiong
    He, Lenian
    Sun, Kexu
    ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING, 2019, 100 (02) : 295 - 309
  • [40] A Low Noise Wide Dynamic Range CMOS Image Sensor with Low-Noise Transistors and 17b Column-Parallel ADC
    Seo, Min-Woong
    Takasawa, Taishi
    Kawahito, Shoji
    Sawamoto, Takehide
    Akahori, Tomoyuki
    Liu, Zheng
    2012 IEEE SENSORS PROCEEDINGS, 2012, : 2204 - 2207