The fault coverage estimation for protocol conformance testing

被引：0
|
作者：
Kolomeez, AV [1 ]
Prokopenko, SA [1 ]
机构：
[1] Tomsk VV Kuibyshev State Univ, Tomsk 634050, Russia
来源：
2004 INTERNATIONAL SIBERIAN WORKSHOPS AND TUTORIALS ON ELECTRON DEVICES AND MATERIALS, EDM 2004, PROCEEDINGS | 2004年
关键词：
D O I：
10.1109/PESC.2004.241138
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper, we study the fault coverage of a transition tour of an Extended Finite State Machine (Extended FSM). We consider single transition, output and assignment faults. The fault coverage is calculated based on the equivalent classical FSM.
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页码：112 / 114
页数：3
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