The fault coverage estimation for protocol conformance testing

被引：0
|
作者：
Kolomeez, AV [1 ]
Prokopenko, SA [1 ]
机构：
[1] Tomsk VV Kuibyshev State Univ, Tomsk 634050, Russia
来源：
2004 INTERNATIONAL SIBERIAN WORKSHOPS AND TUTORIALS ON ELECTRON DEVICES AND MATERIALS, EDM 2004, PROCEEDINGS | 2004年
关键词：
D O I：
10.1109/PESC.2004.241138
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper, we study the fault coverage of a transition tour of an Extended Finite State Machine (Extended FSM). We consider single transition, output and assignment faults. The fault coverage is calculated based on the equivalent classical FSM.
引用
收藏
页码：112 / 114
页数：3
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