Magnetic field and microwave effects on critical current fluctuations in HTS grain-boundary Josephson junctions

被引:7
|
作者
Hao, L
MacFarlane, JC
Pegrum, CM
Sloggett, GJ
Foley, CP
机构
[1] UNIV STRATHCLYDE,DEPT PHYS & APPL PHYS,GLASGOW G4 0NG,LANARK,SCOTLAND
[2] CSIRO,DIV APPL PHYS,LINDFIELD,NSW 2070,AUSTRALIA
关键词
D O I
10.1109/77.621873
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The excess noise levels in HTS grain boundary Josephson junctions, when expressed as critical current fluctuations \delta I-c\, vary linearly with I-c as the temperature changes. By contrast, when the critical current is suppressed by an external magnetic: field, the measured fluctuations \delta I-c\ remain nearly constant while I-c itself undergoes order-of-magnitude changes. This effect, which does not seem to have been widely recognized, is examined with respect to the spatial modulation of the critical current density within the junction. Calculations based on this model are in good agreement with our experimental measurements. In related studies, we measure the excess noise levels between Shapiro steps in a microwave-irradiated junction, and find them to agree with a modified version of the Likharev-Semenov equation for thermal noise.
引用
收藏
页码:2840 / 2843
页数:4
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