A 14-10 b dual-mode low-noise pipeline ADC for high-end CMOS image sensors

被引:2
|
作者
Cho, Suk-Hee [1 ]
Park, Jun-Sang [1 ]
Ahn, Gil-Cho [1 ]
Lee, Seung-Hoon [1 ]
机构
[1] Sogang Univ, Dept Elect Engn, Seoul 121742, South Korea
基金
新加坡国家研究基金会;
关键词
Analog-to-digital converter; Pipeline; CMOS image sensor; Dual-mode; Input-referred noise; Separate reference; DYNAMIC-RANGE; A/D CONVERTER; AMPLIFIER; SFDR;
D O I
10.1007/s10470-014-0356-3
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
This work proposes a low-noise four-stage pipeline ADC operating at 14 b 50 MS/s and 10 b 70 MS/s for high-end CIS applications. In the 10 b 70 MS/s mode, the last-stage MDAC and flash ADC are turned off rather than the first-stage MDAC and flash ADC for the same input-referred noise in both modes. The proposed ADC shares a single amplifier for the first- and second-stage MDACs to reduce power consumption and chip area. The amplifier thermal noise of the SHA and MDACs is minimized by adjusting the trans-conductance of input and current-source transistors while two separate reference voltage drivers for the MDACs and the flash ADCs reduce the switching noise. The prototype ADC in a 0.13 mu m CMOS technology providing 0.35 mu m thick-gate-oxide transistors shows the measured DNL and INL within 0.79 and 2.54 LSB in the 14 b mode, and 0.53 and 0.44 LSB in the 10 b mode, respectively. The ADC shows the maximum SNDR and SFDR of 68.5 and 86.7 dB in the 14 b 50 MS/s mode, and the SNDR and SFDR of 60.5 and 77.8 dB for the 10 b 70 MS/s mode, respectively. The ADC with the measured input-referred noise of 1.20 LSBrms/14 b consumes 192.9 mW at the 14 b 50 MS/s, and 184.9 mW in the 10 b 70 MS/s mode with 3.3/1.2 V dual supplies.
引用
收藏
页码:437 / 447
页数:11
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