INVESTIGATION OF THE He CONTENT WITHIN W COATINGS BY USING GLOW DISCHARGE OPTICAL EMISSION SPECTROMETRY

被引：0

作者：

Grigore, E. ^{[1
]}

Ruset, C. ^{[1
]}

Gherendi, M. ^{[1
]}

Firdaouss, M. ^{[2
]}

Hernandez, C. ^{[2
]}

机构：

[1] Natl Inst Laser Plasma & Radiat Phys, 409 Atomistilor, Magurele 077125, Romania

[2] Inst Rech Fus Confinement Magnet IRFM, Cadarache, France

来源：

ROMANIAN REPORTS IN PHYSICS | 2019年 / 71卷 / 02期

关键词：

Helium retention; W coatings; GDOES; He depth profile; TUNGSTEN;

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

GDOES (Glow Discharge Optical Emission Spectrometry) technique is able to perform depth profile analysis by measuring the intensities of the emission of the excited atomic species removed from the surface of the investigated samples. W coated samples with He content deposited by CMSII (Combined Magnetron Sputtering and Ion Implantation) were used for GDOES measurements. The morphology of the coatings has been investigated by SEM analysis whereas the He content within the layer has been evidenced by TDS (Thermal Desorption Spectroscopy) measurements. The qualitative elemental depth profile across the coating has been measured by GDOES.

引用

页数：7

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