Error Value Driven Fault Analysis Attack

被引:0
|
作者
Yoshikawa, Masaya [1 ]
Goto, Hikaru [1 ]
Asahi, Kensaku [1 ]
机构
[1] Meijo Univ, Dept Informat Engn, Nagoya, Aichi, Japan
关键词
Fault analysis attacks; Error value; Tamper resistance; Side-channel attack;
D O I
暂无
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
The advanced encryption standard (AES) has been sufficiently studied to confirm that its decryption is computationally impossible. However, its vulnerability against fault analysis attacks has been pointed out in recent years. To verify the vulnerability of electronic devices in the future, into which cryptographic circuits have been incorporated, fault Analysis attacks must be thoroughly studied. The present study proposes a new fault analysis attack method which utilizes the tendency of an operation error due to a glitch. The present study also verifies the validity of the proposed method by performing evaluation experiments using FPGA.
引用
收藏
页码:101 / 104
页数:4
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