共 50 条
- [44] Fracture strength of ultrananocrystalline diamond thin films - Identification of Weibull parameters Espinosa, H.D. (espinosa@northwestern.edu), 1600, American Institute of Physics Inc. (94):
- [46] Channel cracking technique for toughness measurement of brittle dielectric thin films on silicon substrates MATERIALS RELIABILITY IN MICROELECTRONICS VIII, 1998, 516 : 331 - 336
- [50] Strength measurement of thick brittle coatings on metals Ceramic Engineering and Science Proceedings, 1998, 19 (04): : 283 - 291