Setup for optimized grazing incidence x-ray absorption experiments on thin films on substrates

被引:32
|
作者
Maurizio, C. [1 ]
Rovezzi, M. [1 ]
Bardelli, F. [1 ]
Pais, H. G. [1 ]
D'Acapito, F. [1 ]
机构
[1] ESRF, CNR, INFM, OGG,GILDA CRG 6, F-38043 Grenoble, France
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2009年 / 80卷 / 06期
关键词
fluorescence; optimisation; substrates; thin films; X-ray absorption spectra; X-ray apparatus; REFLECTION MODE; GILDA BEAMLINE; FINE-STRUCTURE; DISTORTIONS; EXAFS;
D O I
10.1063/1.3155791
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We present a state-of-the-art experimental apparatus and a proper setup to perform x-ray absorption spectroscopy (XAS) experiments in grazing incidence mode. This geometry is appropriate for doped thin films or interfaces buried at moderate depth in a thick matrix, whenever the scattering and/or fluorescence from the matrix has to be strongly attenuated. Both the calculation and the experimental data demonstrate that the specific setup that consists in a grazing incidence and grazing collection geometry is extremely advantageous. In fact, with respect to the standard geometry used to perform XAS experiments in fluorescence mode, the present setup allows an enhancement in the interesting fluorescence signal from the surface layer without a corresponding increase in the elastic scattering contribution from the matrix. The sample holder especially designed for this kind of experiment can work in vacuum and at low temperature. An easy and quick automatic sample alignment procedure is detailed.
引用
收藏
页数:6
相关论文
共 50 条
  • [21] Grazing-incidence X-ray absorption and emission spectroscopy
    Waychunas, GA
    APPLICATIONS OF SYNCHROTRON RADIATION IN LOW-TEMPERATURE GEOCHEMISTRY AND ENVIRONMENTAL SCIENCES, 2002, 49 : 267 - 315
  • [22] Observing hydrogen intercalation into palladium thin films using in situ grazing incidence x-ray diffraction and x-ray reflectivity
    Landers, Alan
    Feaster, Jeremy
    Brown, Kris
    Lin, John
    Farmand, Maryam
    Fackler, Sean
    Nishimura, Yusaku
    Beeman, Jeffrey
    Bajdich, Michal
    Higgins, Drew
    Yano, Junko
    Drisdell, Walter
    Davis, Ryan
    Hahn, Christopher
    Mehta, Apurva
    Jaramillo, Thomas
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2019, 257
  • [23] Modern approaches to investigation of thin films and monolayers: X-ray reflectivity, grazing-incidence X-ray scattering and X-ray standing waves
    Shcherbina, M. A.
    Chvalun, S. N.
    Ponomarenko, S. A.
    Kovalchuk, M. V.
    RUSSIAN CHEMICAL REVIEWS, 2014, 83 (12) : 1091 - 1119
  • [24] Applications of the 'CATGIXRF' computer program to the grazing incidence X-ray fluorescence and X-ray reflectivity characterization of thin films and surfaces
    Tiwari, M. K.
    Lodha, G. S.
    Sawhney, K. J. S.
    X-RAY SPECTROMETRY, 2010, 39 (02) : 127 - 134
  • [25] Analysis of mesoporous thin films by X-ray reflectivity, optical reflectivity and grazing incidence small angle X-ray scattering
    Gibaud, A.
    Dourdain, S.
    Vignaud, G.
    APPLIED SURFACE SCIENCE, 2006, 253 (01) : 3 - 11
  • [26] In situ cell for grazing-incidence x-ray diffraction on thin films in thermal catalysis
    Thum, Lukas
    Arztmann, Manuela
    Zizak, Ivo
    Grueneberger, Rene
    Steigert, Alexander
    Grimm, Nico
    Wallacher, Dirk
    Schlatmann, Rutger
    Amkreutz, Daniel
    Gili, Albert
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2024, 95 (03):
  • [27] Structure analysis of amorphous thin films of GeSbTe compounds by grazing incidence X-ray scattering
    Sato, M
    Matsunaga, T
    Kouzaki, T
    Yamada, N
    ADVANCED DATA STORAGE MATERIALS AND CHARACTERIZATION TECHNIQUES, 2004, 803 : 245 - 250
  • [28] Grazing incidence X-ray diffraction analysis of alkali fluoride thin films for optical devices
    Cremona, M
    Mauricio, MHP
    Fehlberg, LV
    Nunes, RA
    do Carmo, LCS
    de Avillez, RR
    Caride, AO
    THIN SOLID FILMS, 1998, 333 (1-2) : 157 - 164
  • [29] Grazing Incidence X-ray Diffraction Study on Surface Crystal Structure of Polyethylene Thin Films
    Hirohiko Yakabe
    Keiji Tanaka
    Toshihiko Nagamura
    Sono Sasaki
    Osami Sakata
    Atsushi Takahara
    Tisato Kajiyama
    Polymer Bulletin, 2005, 53 : 213 - 222
  • [30] Compositional depth profiling of polycrystalline thin films by grazing-incidence X-ray diffraction
    Koutschau, I. M.
    Schock, H. W.
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2006, 39 : 683 - 696