SiC and GaN devices - wide bandgap is not all the same

被引:94
|
作者
Kaminski, Nando [1 ]
Hilt, Oliver [2 ]
机构
[1] Univ Bremen, Inst Elect Drives Power Elect & Devices, IALB, D-28359 Bremen, Germany
[2] Leibniz Inst Hochstfrequenztech, Ferdinand Braun Inst, Dept Power Elect, GaN Elect, D-12489 Berlin, Germany
关键词
silicon compounds; gallium compounds; III-V semiconductors; wide band gap semiconductors; power semiconductor devices; wide band gap semiconductor device; power electronics; Schottky diodes; semiconductor device packaging; wide bandgap materials; semiconductor device reliability; SiC; GaN; ALGAN/GAN HEMTS; VOLTAGE; MOBILITY; PASSIVATION; TRANSISTORS; SUBSTRATE; IMPACT; LAYER;
D O I
10.1049/iet-cds.2013.0223
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Silicon carbide (SiC)-diodes have been commercially available since 2001 and various SiC-switches have been launched recently. Parallelly, gallium nitride (GaN) is moving into power electronics and the first low-voltage devices are already on the market. Currently, it seems that GaN-transistors are ideal for high frequency ICs up to 1kV (maybe 2kV) and maximum a few 10A. SiC transistors are better suited for discrete devices or modules blocking 1kV and above and virtually no limit in the current but in that range they will face strong competition from the silicon insulated gate bipolar transistors (IGBTs). SiC and GaN Schottky-diodes would offer a similar performance, hence here it becomes apparent that material cost and quality will finally decide the commercial success of wide bandgap devices. Bulk GaN is still prohibitively expensive, whereas GaN on silicon would offer an unrivalled cost advantage. Devices made from the latter could be even cheaper than silicon devices. However, packaging is already a limiting factor for silicon devices even more so in exploiting the advantage of wide bandgap materials with respect to switching speed and high temperature operation. After all, reliability is a must for any device no matter which material it is made of.
引用
收藏
页码:227 / 236
页数:10
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