Lowering the cost of test: ATPG vs. BIST

被引：0
|
作者：
Hay, C [1 ]
机构：
[1] Synopsys Inc, Mt View, CA 94043 USA
来源：
INTERNATIONAL TEST CONFERENCE 2001, PROCEEDINGS | 2001年
关键词：
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：1180 / 1180
页数：1
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