Comments on "Ill conditioning in self-heating FET models"

被引：2

作者：

Parker, AE

机构：

[1] Department of Electronics, Macquarie University, Sydney, NSW

来源：

IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS | 2002年 / 12卷 / 09期

关键词：

circuit simulation; microwave FETs;

D O I：

10.1109/LMWC.2002.803141

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A recent letter(1) reported ill conditioning in nonlinear circuit simulators caused by the introduction of self-heating effects into FET models. This is true for circumstances outlined in that work but is a consequence of using an incomplete thermal model. This letter points out that an account for both thermal potential and mobility variation with temperature will eliminate the problem.

引用

页码：351 / 352

页数：2

共 50 条

[1] Ill conditioning in self-heating FET models
Maas, SA
[J]. IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, 2002, 12 (03) : 88 - 89
[2] Comments on "Ill conditioning in self-heating FET models" - Author's reply
Mass, S
[J]. IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, 2002, 12 (09) : 352 - 352
[3] Broad-band characterization of FET self-heating
Parker, AE
Rathmell, JG
[J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2005, 53 (07) : 2424 - 2429
[4] Self-Heating and Thermal Network Model for Complementary FET
Zhao, Songhan
Cai, Linlin
Chen, Wangyong
He, Yandong
Du, Gang
[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2022, 69 (01) : 11 - 16
[5] Investigation of Self-heating and Thermal Network for Complementary FET
Zhao, Songhan
Cai, Linlin
Chen, Wangyong
Liu, Xiaoyan
Du, Gang
[J]. 2021 SILICON NANOELECTRONICS WORKSHOP (SNW), 2021, : 49 - 50
[6] Impact of NBTI Aging on Self-Heating in Nanowire FET
Prakash, Om
Amrouch, Hussam
Manhas, Sanjeev
Henkel, Joerg
[J]. PROCEEDINGS OF THE 2020 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE 2020), 2020, : 1514 - 1519
[7] Optimization of vertically stacked nanosheet FET immune to self-heating
Balasubbareddy, M.
Sivasankaran, K.
Atamuratov, Atabek E.
Khalilloev, Mahkam M.
[J]. MICRO AND NANOSTRUCTURES, 2023, 182
[8] Analysis on Self-Heating Effects in Three-Stacked Nanoplate FET
Kim, Hyunsuk
Son, Dokyun
Myeong, Ilho
Kang, Myounggon
Jeon, Jongwook
Shin, Hyungcheol
[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2018, 65 (10) : 4520 - 4526
[9] On the Formulation of Self-Heating Models for Circuit Simulation
Zhang, Lining
Song, Debin
Xiao, Ying
Lin, Xinnan
Chan, Mansun
[J]. IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, 2018, 6 (01): : 291 - 297
[10] Models include device self-heating effects
不详
[J]. ELECTRONIC DESIGN, 1996, 44 (13) : 178 - 178

← 1 2 3 4 5 →