Quantifying hidden defect in multi-layered structures by using eddy current system combined with a scanner

被引：0
|
作者：
Huang, Pingjie [1 ]
Zhou, Zekui [1 ]
Wu, Zhaotong [1 ]
机构：
[1] Zhejiang Univ, Dept Control Sci & Engn, Hangzhou 310027, Peoples R China
来源：
7th International Symposium on Measurement Technology and Intelligent Instruments | 2005年 / 13卷
关键词：
D O I：
10.1088/1742-6596/13/1/088
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
The eddy current testing forward model of scanning inspection of multi-layered structures is introduced and simulation work is carried out to reveal the interaction between the scanning coil and defects with different geometric properties. A multi-frequency ECT experimental instrument combined with a scanner is established and scanning inspections are performed to detect the artificial etched flaws with different geometric parameters in the multi-layered structures. The predicted signals by the forward model are compared with the measured signals and the defects are characterized.
引用
收藏
页码：385 / 388
页数：4
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