Manufacturing at nanoscale: Top-down, bottom-up and system engineering

被引:28
|
作者
Zhang, X [1 ]
Sun, C [1 ]
Fang, N [1 ]
机构
[1] Univ Calif Los Angeles, Dept Mech & Aerosp Engn, Ctr Scalable & Integrated Nanomfg, Los Angeles, CA 90095 USA
基金
美国国家科学基金会;
关键词
nanoscale; manufacturing; plasmonic imaging lithography; ultra-molding and imprinting; hybrid top-down and bottom-up process; system engineering;
D O I
10.1023/B:NANO.0000023232.03654.40
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The current nano-technology revolution is facing several major challenges: to manufacture nanodevices below 20 nm, to fabricate three-dimensional complex nano-structures, and to heterogeneously integrate multiple functionalities. To tackle these grand challenges, the Center for Scalable and Integrated NAno-Manufacturing (SINAM), a NSF Nanoscale Science and Engineering Center, set its goal to establish a new manufacturing paradigm that integrates an array of new nano-manufacturing technologies, including the plasmonic imaging lithography and ultramolding imprint lithography aiming toward critical resolution of 1 - 10 nm and the hybrid top-down and bottom-up technologies to achieve massively parallel integration of heterogeneous nanoscale components into higher-order structures and devices. Furthermore, SINAM will develop system engineering strategies to scale-up the nano-manufacturing technologies. SINAMs integrated research and education platform will shed light to a broad range of potential applications in computing, telecommunication, photonics, biotechnology, health care, and national security.
引用
收藏
页码:125 / 130
页数:6
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