High resolution microscopy techniques for the analysis of biological samples: a comparison

被引：12
|
作者：
Milani, M
Ballerini, M
Batani, D
Squadrini, F
Cotelli, F
Donin, CLL
Poletti, G
Pozzi, A
Eidmann, K
Stead, A
Lucchini, G
机构：
[1] Univ Milano Bicocca, Dipartimento Sci Mat, I-20126 Milan, Italy
[2] Univ Milano Bicocca, INFM, I-20126 Milan, Italy
[3] Univ Milano Bicocca, Dipartimento Fis G Occhialini, I-20126 Milan, Italy
[4] Univ Modena, Inst Infect & Trop Dis, I-41100 Modena, Italy
[5] Univ Milan, Milan, Italy
[6] Max Planck Inst Quantum Opt, MPQ, Garching, Germany
[7] Univ London, Royal Hallway Coll, London WC1E 7HU, England
来源：
EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS | 2004年 / 26卷 / 02期
关键词：
D O I：
10.1051/epjap:2004029
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Performances and advantages of different high-resolution microscopy techniques are compared. These include Soft X-ray Contact Microscopy (SXCM), Atomic Force Microscopy (AFM), Focused Ion Beam (FIB) and Transmission Electron Microscopy (TEM). It is shown that they allow complementary approaches to imaging of biological objects. These techniques have been used to image the same type of cells (Saccharomyces cerevisiae) thus providing a common benchmark. In particular it is shown that the novel FIB technique allows easy target cell selection, fast operation, high resolution, 3D imaging and sample manipulation during imaging.
引用
收藏
页码：123 / 131
页数：9
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