Radiation damage impact on hybrid-pixel detectors data

被引：3

作者：

Magalhaes, D. P. ^{[1
]}

Rinkel, J. ^{[2
]}

Tomal, A. ^{[2
]}

机构：

[1] Brazilian Synchrotron Light Lab LNLS, BR-13083100 Campinas, SP, Brazil

[2] Univ Estadual Campinas, Gleb Wataghin Phys Inst, BR-13083859 Campinas, SP, Brazil

来源：

RADIATION PHYSICS AND CHEMISTRY | 2019年 / 160卷

基金：

巴西圣保罗研究基金会;

关键词：

Hybrid pixel detectors; X-ray Imaging; Radiation damage; OXIDES;

D O I：

10.1016/j.radphyschem.2019.03.011

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

This work aimed to quantify the influence of the deposited dose at the hybrid detector ASIC on the resulting image quality. Low (932 +/- 4 Gy) and high (6310 +/- 24 Gy) dose experiments were performed by irradiating a Medipix3RX single chip detector with the polychromatic beam from the Brazilian Synchrotron X-ray Imaging beamline. It was possible to evaluate subtle effects by using a noise component model based on estimating the quantum, electronic and structural noise contributions. Visible effects were quantified by analyzing the evolution of the histogram of the pixel counts at the irradiated area. The dose threshold for subtle damages was 388 +/- 3 Gy deposited in the gate oxide and shallow trench isolation oxide layers, while visible damages were observed for doses higher than 2635 +/- 15 Gy. A recovery of the damaged pixels with time was noticed and quantified, reaching the half-life time at 1.84 +/- 0.02 h after irradiation. These results encourage periodical maintenance procedures, for example through a new equalization matrix generation, which proved to be a possible tool for recovering the detector performance.

引用

页码：63 / 67

页数：5

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