Defect detection on patterned jacquard fabric

被引：0
|
作者：
Ngan, HYT [1 ]
Pang, GKH [1 ]
Yung, SP [1 ]
Ng, MK [1 ]
机构：
[1] Univ Hong Kong, Dept Elect & Elect Engn, Hong Kong, Hong Kong, Peoples R China
来源：
32ND APPLIED IMAGERY PATTERN RECOGNITION WORKSHOP, PROCEEDINGS | 2004年
关键词：
D O I：
暂无
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
The techniques for defect detection on plain (unpatterned) fabrics have been well developed nowadays. This paper is on developing visual inspection methods for defect detection on patterned fabrics. A review on some defect detection methods on patterned fabrics will be given. Then, a new method for patterned fabric inspection called Golden Image Subtraction (GIS) is introduced. GIS is an efficient and fast method, which can segment out the defective regions on patterned fabric effectively. An improved version of the GIS method using wavelet transform is also given. This research result will contribute to the development of an automated fabric inspection machine for the textile industry.
引用
收藏
页码：163 / 168
页数：6
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