CHALLENGES IN MATERIAL SELECTION FOR SIP APPLICATIONS

被引:0
|
作者
Lim, Sze-Pei [1 ]
机构
[1] Indium Corp, Singapore, Singapore
关键词
SiP; heterogeneous integration; flip-chip; flux; solder paste;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The recent surge in demand for system-in-package (SiP) applications is driven by the rapid development of connected "smart" devices. The versatility and capability of heterogeneous integration for SiP have made it a popular choice of packaging solutions for increased functionality in a smaller package form factor. This continues to push miniaturization to an even greater level, therefore creating assemblies with smaller component and greater density. Soldering materials, such as solder paste and flip-chip fluxes, will need to be chosen appropriately in order to form reliable solder joints and maximize production yields for complicated SiP applications. Fine feature solder paste printing for passive component sizes, down to 008004 (0.25 x 0.125mm) and smaller, or wafer level CSP (WLCSP) with small pad designs of less than 100 mu m in diameter, has become more challenging in SiP assembly. The appropriate choice of solder powder size, rheology of solder paste, and stencil design are crucial to achieve consistency in solder paste printing performance, which includes good printing transfer efficiency, minimal bridging down to 50 mu m gap between neighboring pads and at least 8 hours stencil life. Good wetting, graping resistance, and minimal voiding are some of the key attributes of solder paste to consider as well. On the other hand, as technology drives toward finer pitch components, combined with reduced bondline thickness or standoff of flip-chip or other IC packages, makes cleaning flux residue more challenging. The shift towards using semiconductor-grade ultra-low residue no-clean flip-chip fluxes or solder pastes, which eliminates the cleaning process, is therefore the solution for overcoming these challenges. The flux residue left behind after the soldering process is minimal and compatible with the underfill or molding material used in the subsequent process. This paper will address the challenges and discuss basic guidelines in detail with testing results, for selecting appropriate solder pastes and flip-chip fluxes based on different SiP designs and requirements in the packaging industry.
引用
收藏
页数:8
相关论文
共 50 条
  • [1] Selection of applications for a material
    Salimon, A
    Bréchet, Y
    Ashby, MF
    Greer, AL
    ADVANCED ENGINEERING MATERIALS, 2004, 6 (04) : 249 - 265
  • [2] Challenges in Fine Feature Solder Paste Printing for SiP Applications
    Lim, Sze Pei
    Thum, Kenneth
    Mackie, Andy C.
    Advancing Microelectronics, 2020, 47 (05): : 6 - 11
  • [3] A Versatile SoC/SiP Sensor Interface for Industrial Applications: Implementation Challenges
    Ali, Mohamed
    Hassan, Ahmad
    Honarparvar, Mohammad
    Nabavi, Morteza
    Audet, Yves
    Sawan, Mohamad
    Savaria, Yvon
    IEEE ACCESS, 2022, 10 : 24540 - 24555
  • [4] Material selection for high temperature applications
    G. Zonfrillo
    I. Giovannetti
    M. Manetti
    Meccanica, 2008, 43
  • [5] Material selection for high temperature applications
    Zonfrillo, G.
    Giovannetti, I.
    Manetti, M.
    MECCANICA, 2008, 43 (02) : 125 - 131
  • [6] Hybrid material challenges TPO in interior applications
    Moore, S
    MODERN PLASTICS, 1999, 76 (09): : 29 - 30
  • [7] Materials selection for nuclear applications: Challenges and opportunities
    Hosemann, P.
    Frazer, D.
    Fratoni, M.
    Band, A.
    Ashby, M. F.
    SCRIPTA MATERIALIA, 2018, 143 : 181 - 187
  • [8] SiP technologies: Perspectives and challenges
    Cauvet, P.
    IEEE DTIS: 2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology, Proceedings, 2006, : 4 - 4
  • [9] APPLICATIONS AND MATERIAL CONDITIONS DRIVE SELECTION CRITERIA
    Randolph
    NJ, United States
    Lab. Manager., 2009, 3 (48-49):
  • [10] Material selection for low-temperature applications
    Kumar, S
    HYDROCARBON PROCESSING, 2004, 83 (07): : 85 - +