Application of the TIARA Radiation Transport Tool to Single Event Effects Simulation

被引：26

作者：

Roche, P. ^{[1
,5
]}

Gasiot, G. ^{[1
,5
]}

Autran, J. L. ^{[2
,3
,5
]}

Munteanu, D. ^{[2
,3
,5
]}

Reed, R. A. ^{[4
]}

Weller, R. A. ^{[4
]}

机构：

[1] STMicroelectronics, F-38926 Crolles, France

[2] Aix Marseille Univ, F-13397 Marseille 20, France

[3] CNRS, IM2NP, UMR CNRS 7334, Fac Sci Serv 142, F-13397 Marseille 20, France

[4] Vanderbilt Univ, Dept Elect Engn & Comp Sci, Nashville, TN 37235 USA

[5] Radiat Effects & Elect Reliabil REER Lab, Marseille, France

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2014年 / 61卷 / 03期

关键词：

Monte Carlo radiation transport; single event effects; MONTE-CARLO SIMULATIONS; SOFT-ERROR RATE; NM BULK SRAM; MODEL; PREDICTION; NEUTRONS; UPSET; SEU;

D O I：

10.1109/TNS.2014.2318778

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Recently (IEEE Trans. Nucl. Sci., Vol. 60, No. 3, pp. 1876-1911, 2013), Reed et al. published an anthology of contributions from different research groups, each developing and/or applying Monte Carlo-based radiation transport tools to simulate a variety of effects that result from energy transferred to a semiconductor material by a single particle event. The Tool suIte for rAdiation Reliability Assessment (TIARA) simulation platform and its development by STMicroelectronics and Aix-Marseille University is described in this paper as a complement to this anthology.

引用

页码：1498 / 1500

页数：3

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