Anthology of the Development of Radiation Transport Tools as Applied to Single Event Effects

被引：50

作者：

Reed, R. A. ^{[1
,2
]}

Weller, R. A. ^{[1
,2
]}

Akkerman, A. ^{[3
]}

Barak, J. ^{[3
]}

Culpepper, W. ^{[8
]}

Duzellier, S. ^{[4
]}

Foster, C. ^{[8
]}

Gaillardin, M. ^{[5
]}

Hubert, G. ^{[4
]}

Jordan, T. ^{[6
]}

Jun, I. ^{[7
]}

Koontz, S. ^{[8
]}

Lei, F.

McNulty, P. ^{[9
]}

Mendenhall, M. H. ^{[1
,2
]}

Murat, M. ^{[3
]}

Nieminen, P. ^{[10
]}

O'Neill, P. ^{[8
]}

Raine, M. ^{[5
]}

Reddell, B. ^{[8
]}

Saigne, F. ^{[11
]}

Santin, G. ^{[10
,12
]}

Sihver, L. ^{[13
,14
,15
]}

Tang, H. H. K.

Truscott, P. R. ^{[16
]}

Wrobel, F. ^{[11
]}

机构：

[1] Vanderbilt Univ, Dept Elect Engn & Comp Sci, Nashville, TN 37212 USA

[2] Vanderbilt Univ, Inst Space & Def Elect, Nashville, TN 37212 USA

[3] Soreq NRC, IL-81800 Yavne, Israel

[4] French Aerosp Lab ONERA, F-31055 Toulouse, France

[5] CEA, DAM, DIF, F-91297 Arpajon, France

[6] EMP Consultants, Gaithersburg, MD 20885 USA

[7] CALTECH, Jet Prop Lab, Pasadena, CA 91109 USA

[8] NASA, Lyndon B Johnson Space Ctr, Houston, TX 77058 USA

[9] Clemson Univ, Dept Phys & Astron, Clemson, SC 29634 USA

[10] ESA ESTEC, Space Environments & Effects Sect TOS EES, NL-2200 AG Noordwijk, Netherlands

[11] Univ Montpellier 2, F-34095 Montpellier 5, France

[12] Rhea Syst SA, B-1348 Louvain, Belgium

[13] Chalmers Univ Technol, S-41296 Gothenburg, Sweden

[14] Roanoke Coll, Salem, VA 24153 USA

[15] Texas A&M Univ, College Stn, TX 77843 USA

[16] Kallisto Consultancy Ltd, Yorktown Hts, NY 10598 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2013年 / 60卷 / 03期

关键词：

Monte Carlo radiation transport; single event effects; NEUTRON-INDUCED SEU; MONTE-CARLO CALCULATIONS; INDUCED SOFT ERRORS; ACCURATE UNIVERSAL PARAMETERIZATION; INDUCED NUCLEAR-REACTIONS; HEAVY-ION TRANSPORT; ABSORPTION CROSS-SECTIONS; UPSET RATE PREDICTION; SILICON-ON-INSULATOR; MULTIPLE-BIT UPSETS;

D O I：

10.1109/TNS.2013.2262101

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This anthology contains contributions from eleven different groups, each developing and/or applying Monte Carlo-based radiation transport tools to simulate a variety of effects that result from energy transferred to a semiconductor material by a single particle event. The topics span from basic mechanisms for single-particle induced failures to applied tasks like developing websites to predict on-orbit single event failure rates using Monte Carlo radiation transport tools.

引用

页码：1876 / 1911

页数：36

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